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The 14th International Conference on Beam Injection Assessment of Microstructures in Semiconductors will be held at Koreana Hotel, Seoul, Korea, during June 18-21, 2018.

Join us at BIAMS 2018 to learn more about our cutting-edge atomic force microscopy solutions for your research and industry application needs. Especially, Dr. Sang-il Park, Founder and CEO of Park Systems who was the first to commercialize the AFM, as plenary speaker, will introduce the key AFM techniques that enable innovations to meet the needs of semiconductor manufacturers to improve production yield and device performance and show successful examples of new semiconductor advanced metrology for nano devices of the future.
We look forward to discussing your particular nanoscale research/engineering challenges as well as the solutions we have ready to meet your requirements.


  • TITLE: BIAMS 2018
  • PERIOD: June 18(Mon.) – June 21(Thur.), 2018
  • EXHIBITION PERIOD: June 18(Mon.) 13:00-18:00 / June 19(Tue.) 09:00-16:00


About BIAMS 2018:

The BIAMS is a series of biennially held conferences that started in Meudon, France in 1988. The main goal of the BIAMS conference is to provide a well-organized international forum to discuss advances in the field of the physical characterization of semiconductors by means of beam injection and related methods. The BIAMS 2018 will cover broad fields of application such as micro- and nano- electronics, photovoltaic, device degradation, semiconductor defects, nanophotonics, and etc.

Link: http://www.biams2018.org

Atomic Force Microscopy | Park Systems