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Advances in Materials Nanocharacterization and Material Analysis in small and large sample research

Late Night AFM Workshop ver.2

THE LATE-NIGHT AFM WORKSHOP

Advances in Materials Nanocharacterization and Material Analysis in small and large sample research

Date: 16 March, 2020

Time: 21:00 p.m.

Place: Le forum des microscopies à sonde locale

We will showcase the capabilities of the Park NX20 AFM, the leading large sample Atomic Force Microscope (AFM) with the wide range of nanomechanical, magnetic and electrical material characterization modes, such as:

      • PinPoint™ nanomechanical mapping for characterizing the mechanical properties of samples in real-time
      • conductive AFM (C-AFM) for imaging of local electronic and morphological properties
      • new generation KPFM mode!

SHORT AGENDA

          21:00 Champaign & Snack Welcome

          21:30 Presentation, Dr. Andrea Cerreta, Application Scientist

          22:00 Live Demonstration on Park NX20 Large Sample AFM

The LATE-NIGHT AFM Workshop is open to everyone and is FREE of charge.

Park Workshops | Park Atomic Force Microscope