原子力显微镜的专家们提供线上在线课堂教学方式, 足不出户也可以免费听取AFM课程:课程包括网络讲座,Live Demos, AFM相关教育视频,软件运作和纳米科学论坛等视频!

即将开始的网络讲座直播

Advanced High Vacuum Magnetic Force Microscopy (MFM): study of topological spin textures

Wednesday, May 20, 2020 / 11:00 am CEST

In this talk I’ll present you, from the Engineer point of view, the contribution of MFM in various experimental configurations to the undergoing research at UMPhy on ferromagnetic and antiferromagnetic skyrmions.

Investigation of thermoelectric material using atomic force microscopy (Chinese/中文)

Thursday, May 21, 2020 / 10:00 am CST

This webinar consists of two parts: (1)Theory and operation of Kelvin probe force microscopy (2) Investigation of thermoelectric material SnSe using AFM.

4D Printing and Stimuli Response

Friday, May 22, 2020 / 9:00 am PDT

This webinar session will give some insights into understanding the 4D transformation of materials which govern both design of shape and material properties.

Advances in AFM: Beyond Imaging (Spanish/español)

Friday, May 22, 2020 / 10:00 am CDT

Nuestro conocimiento técnico de diversas aplicaciones ayuda a los investigadores a encontrar una manera de examinar sus muestras con precisión y reproducibilidad.

Advances in Scanning Capacitance Microscopy for Electrical Nanocharacterization and Failure Analysis

Wednesday, May 27, 2020 / 11:00 am CEST

In this webinar, we provide an overview and introduction into SCM using a Park Systems NX20 AFM. Furthermore, we will explore the additional options that can be added to traditional SCM using our SmartScan™ Software for improving measurement results and repeatability.

Live Demo

SmartScan Lithography

Friday, May 22, 2020 / 12:00 pm PDT

Park AFM’s nanolithography is an advanced AFM technique used to pattern nanoscale shapes onto sample surfaces.

SmartScan SCM Imaging

Friday, May 15, 2020 / 12:00 pm PDT

It provides doping concentration information over the sample surface by measuring the capacitance change between tip and sample.

Full-automation AFM in-line capabilities with the NX-Wafer

Wednesday, May, 6, 2020 / 16:00 pm CEST

In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control.

SmartScan MFM Imaging

Friday, May 1, 2020 / 12:00 pm PDT

Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized cantilever and the sample surface.

SmartScan Advanced KPFM Imaging

Friday, April 24, 2020 / 12:00 pm PDT

Measuring the electrostatic interaction between the atomic force microscope (AFM) tip and sample is a common technique used to characterize electrically sensitive samples.

From automatization in research to quality control for industrial applications

Wednesday, April 22 , 2020 / 10:30 am CEST

In this Live Demo we will walk you through the quick automation set-up for research applications by using SmartScan & StepScan.

网络讲座复播视频

Nanotechnology in Plastics and Packaging

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Nanotechnology in Plastics and Packaging.

Surface Plasmon Resonance Spectroscopy Tandem with AFM

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Surface Plasmon Resonance Spectroscopy Tandem with AFM.

Viscoelastic Surfactants and Oilfield Chemicals

The Park Systems 2019 Material Science Research and AFM Webinar Series continues with Viscoelastic Surfactants and Oilfield Chemicals.

Physical Properties of Emergent 2D materials with AFM

In this webinar, the reporter will share some of the experience of using Park AFM (XE 100 and NX10). Since 2011, the reporter has used Park AFM as the main research tool, and made some interesting researches in the study of 2D material properties, the characterization of optoelectronic devices, and the exploration of novel 2D material electronic devices.

2D Nanomaterials for Smart Coatings and Fluids

2-D nanomaterials are known for its property of being only one or two atoms thick. Due to their high ratio of surface area to volume, they immensely benefit from unique physical, chemical, and biological functionality.

Electrochemical Capacitors: Fundamentals, Materials, and Advanced Characterization

This webinar is the first of a two-part webinar series focused on ECs. The first webinar is focused on the fundamental of charge storage in ECs and recent advances in the development of materials for these devices.

Nanostructured Polymer Brushes With AFM

The Park Systems 2019 Material Science Research and AFM Webinar Series kicks off with Nanostructured Polymer Brushes With AFM, focusing on how Atomic Force Microscopy is a vital tool in characterizing the morphology of grafted polymer brushes.

教育型网络讲座“AFM技术”

Atomic Force Microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping – Cantilever Modulus and Applied Force

The applications staff of Park Systems will give this webinar on atomic force microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping, specifically, we will look at the influence of cantilever stiffness and applied force on the measured modulus.

PinPoint Piezoelectric Force Microscopy

PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.

Electrochemical Atomic Force Microscopy (EC-AFM)

In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.

PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness

PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.

Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)

SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.

NanoScientific Talks

Topic Speaker
Nanomechanics & Electrical Characterization
External Energy Assisted Nanomachining Using Soft AFM Probes Dr. Jia Deng, Binghamton University - SUNY, NSS US 2019
Atomic Force Microscopies to study Electronic Properties and Strain in Thin Films for Flexible Electronics Tobias Cramer, University of Bologna, Italy I NSFE 2018
The growth of organic ultra-thin films on silicon oxides with variable vacancy states: a Scanning Force Microscopy approach Cristiano Albonetti, CRN – ISMN, Italy I NSFE 2018
Detection of Hydrophobic Interactions on Rough Surfaces via Atomic Force Microscopy: from Measurement to Modelling Urs Peuker, TU Bergakademie Freiberg, Germany NSFE 2018
AFM Methodology
Chemical Sensitivity for Scanning Probe Microscopy Lukas Eng, Tech. University Dresden I NSFE 2018
Electrochemical measurements of single nanoparticles Kim McKelvey, Trinity College Dublin I NSFE 2019
Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires Dr. Ye Tao, Rowland Institute at Harvard I NSS US 2018
3D Nanoscaffold Cantilevers for Potential Applications in High Speed Wafer Scale Imaging Hoa Le, The Rowland Institute at Harvard, NSS US 2019
Scanning Capacitance Spectroscopy for Dopant Analysis on Nanoscale Semiconductor Devices Phil Kaszuba, Global Foundries US I NSS US 2019
Measuring Ions and Electrons with Nanoscale Pipettes Dr. Lane Baker, Indiana University, NSS U 2019
Life Science and Biotechnology
Revisiting the Early Aggregation of Amyloids by AFM Single Molecule Statistical Analysis Francesco S. Ruggeri, University of Cambridge I NSFE 2018
Probing the Intersection of Nanotechnology and Biology Dr. Nathaniel Cady, Colleges of Nanoscale Science & Engineering I NSS US 2019
Metallo-DNA molecules as a tool for nanoscience and nanotechnology Miguel A. Galindo, CIC, University of Granada I NSFE 2019
AFM Applications in biology and medicine Malgorzata Lekka, Institute of Nuclear Physics, Poland I NSFE 2019
Organic Interfaces and Semiconductors
Measurement Challenges arising from New Semiconductor Materials and Structures for Integrated Circuits Dr. Alain Diebold, SUNY Polytechnic Institute I NSS US 2019
Characterizing photoelectric and ferroelectric properties of materials with scanning probe microscope Akash Bhatnagar, Centre for Innovation Competence SiLi-nano I NSFE 2019
SPM Study of Tribo-Photovaltaic Effect in Metal, Semiconductor Moving Contacts Jun Liu, University at Buffalo I NSS US 2019

ONLINE NanoAcademy