纳米在线课程 原子力显微镜的专家们提供线上在线课堂教学方式, 足不出户也可以免费听取AFM课程:课程包括网络讲座,Live Demos, AFM相关教育视频,软件运作和纳米科学论坛等视频!

近期网络讲座

Surface Potential Imaging via Sideband KPFM - August 26, 2020

Wednesday, August 26, 2020 /9:00 am PDT

This webinar will introduce Sideband KPFM, using F14H20 as an object of study for the surface potential measurements.

二维材料界面结构与性质的原子力探针显微学研究

2020年8月27日*星期四/ 11:00 am CST

近年来,由于其潜在的巨大应用价值,关于二维层状材料的基础和应用研究方兴未艾,核心工作是理解和控制其多种多样的有趣性质。之前的研究工作主要集中在二维材料的面内结构,多种多样的层间相互作用在调控其力学、电学、热学以及光学等性质方面也有重要作用。

Better in Vacuum – boosting the characterization of 2D semiconductors via electrical AFM in high vacuum

Thursday, 3 September 2020 / 11:00 am CEST

This webinar explains the basics of EC-AFM and investigation of localized electrochemical deposition and dissolution of copper using the Park NX12 AFM System.

Flow Chemistry and Polymerizations

Friday, August 21, 2020 /9:00 am – 10:00 pm PDT

This is the sixth webinar in our 2020 Material Science Research and AFM Webinar Series, designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.

Electrochemical AFM (EC-AFM): Copper Deposition/Dissolution on Gold

Tuesday, August 11, 2020 /2:00 pm SGT

This webinar explains the basics of EC-AFM and investigation of localized electrochemical deposition and dissolution of copper using the Park NX12 AFM System.

Application of atomic force microscopy in the study of edible coatings

Tuesday, July 31, 2020 / 10:00 am CDT

El uso de biopolímeros para la construcción de empaques ha ganado interés como una manera de disminuir los problemas de contaminación y el reciclaje, sin embargo, los cambios que provoca la mezcla de estos polímeros en las propiedades mecánicas...

SmartLitho Creating nanometer sized structures with ease

Tuesday, July 28, 2020 / 2:00 pm SGT

This webinar will show the ease of use of the new Park SmarLitho software and diverse oxide-based nanolithography experiments.

Better in Vacuum – how high vacuum improves the accuracy of nanoscale AFM characterization (on NX-Hivac AFM)

Thursday, July 23, 2020 /11:00 am CEST

The webinar will give a full introduction to the high vacuum AFM functions and will show the easy-to-use pumping station interface.

Pipe Protective Coatings

Friday, July 17, 2020 / 9:00 am PDT

This is the fifth webinar in our 2020 Material Science Research and AFM Webinar Series, designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.

网络讲座复播视频

用原子力显微镜研究热电材料中的缺陷物理

原子力显微镜在材料表面形貌和性质的研究中起着重要的作用,不仅可以用于薄膜材料,也可以用于研究单晶表面。热电材料能够利用赛贝克(Seebeck)效应收集废热发电,是一种潜在的绿色能源材料。


原子力显微镜用于体相异质结太阳能电池

原子力显微镜(AFM)是最强大的扫描探针显微镜(SPM)技术之一,其能将薄膜的局部性质和微区形貌在微米尺度上统一起来,在诸多研究领域得到了广泛的应用。同时,无铅金属卤化物钙钛矿材料,由于其稳定性和对环境无毒性的优点,在LED和太阳能电池方面展现出巨大的研究潜力。


原子力显微镜在钙钛矿太阳能电池中的应用

更多信息请关注公众号:帕克原子力显微镜Park 原子力显微镜(AFM)是最强大的扫描探针显微镜(SPM)技术之一,其不仅可以探测薄膜的形貌,而且可以表征薄膜的相组成和表面电势。与此同时,钙钛矿太阳能电池近期也引起了人们的广泛兴趣,而钙钛矿薄膜的形态和质量对器件性能有着至关重要的影响。


扫描隧道显微镜(STM)最新技术和 Park SmartScan

Park原子力显微镜的应用团队很自豪地向您推荐我们的扫描隧道显微镜(STM)模式,这是一种可以在垂直和水平方向实现原子分辨率的表征技术。



原子力探针显微术基础及其研究进展网络讲堂系列

纳米科学与技术是当今前沿基础科学和高新技术研究中最具有发展潜力的领域之一,也是国际科技竞争的战略制高点。



教育型网络讲座“AFM技术”

Atomic Force Microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping – Cantilever Modulus and Applied Force

The applications staff of Park Systems will give this webinar on atomic force microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping, specifically, we will look at the influence of cantilever stiffness and applied force on the measured modulus.

PinPoint Piezoelectric Force Microscopy

PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.

Electrochemical Atomic Force Microscopy (EC-AFM)

In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.

PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness

PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.

Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)

SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.

NanoScientific Talks

Topic Speaker
Nanomechanics & Electrical Characterization
External Energy Assisted Nanomachining Using Soft AFM Probes Dr. Jia Deng, Binghamton University - SUNY, NSS US 2019
Atomic Force Microscopies to study Electronic Properties and Strain in Thin Films for Flexible Electronics Tobias Cramer, University of Bologna, Italy I NSFE 2018
The growth of organic ultra-thin films on silicon oxides with variable vacancy states: a Scanning Force Microscopy approach Cristiano Albonetti, CRN – ISMN, Italy I NSFE 2018
Detection of Hydrophobic Interactions on Rough Surfaces via Atomic Force Microscopy: from Measurement to Modelling Urs Peuker, TU Bergakademie Freiberg, Germany NSFE 2018
AFM Methodology
Chemical Sensitivity for Scanning Probe Microscopy Lukas Eng, Tech. University Dresden I NSFE 2018
Electrochemical measurements of single nanoparticles Kim McKelvey, Trinity College Dublin I NSFE 2019
Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires Dr. Ye Tao, Rowland Institute at Harvard I NSS US 2018
3D Nanoscaffold Cantilevers for Potential Applications in High Speed Wafer Scale Imaging Hoa Le, The Rowland Institute at Harvard, NSS US 2019
Scanning Capacitance Spectroscopy for Dopant Analysis on Nanoscale Semiconductor Devices Phil Kaszuba, Global Foundries US I NSS US 2019
Measuring Ions and Electrons with Nanoscale Pipettes Dr. Lane Baker, Indiana University, NSS U 2019
Life Science and Biotechnology
Revisiting the Early Aggregation of Amyloids by AFM Single Molecule Statistical Analysis Francesco S. Ruggeri, University of Cambridge I NSFE 2018
Probing the Intersection of Nanotechnology and Biology Dr. Nathaniel Cady, Colleges of Nanoscale Science & Engineering I NSS US 2019
Metallo-DNA molecules as a tool for nanoscience and nanotechnology Miguel A. Galindo, CIC, University of Granada I NSFE 2019
AFM Applications in biology and medicine Malgorzata Lekka, Institute of Nuclear Physics, Poland I NSFE 2019
Organic Interfaces and Semiconductors  
Measurement Challenges arising from New Semiconductor Materials and Structures for Integrated Circuits Dr. Alain Diebold, SUNY Polytechnic Institute I NSS US 2019
Characterizing photoelectric and ferroelectric properties of materials with scanning probe microscope Akash Bhatnagar, Centre for Innovation Competence SiLi-nano I NSFE 2019
SPM Study of Tribo-Photovaltaic Effect in Metal, Semiconductor Moving Contacts Jun Liu, University at Buffalo I NSS US 2019
   

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