AFM Probe Selection Guide
How to choose an AFM probe
How to choose an AFM probe
NanoIndentation
For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.
| Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote |
| NM-RC-SEM | 350 | 750 |  |
▪ Cantilever with high force constant for Nanoindentation ▪ Tip shape: cone ▪ Single crystal diamond tip ▪ Typical tip length: ~500 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type only ▪ For exact values of tip height & radius and half-cone angle, SEM image data is provided |
Request for Quote |
