Park NX12
A versatile microscopy platform for analytical chemistry researchers and shared user facilities
- Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
- Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
- Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration
Proven Park NX10 performance Equipped with Inverted Optical Microscopy
Park NX12 couples the versatility and accuracy of Park’s AFM with a sample stage for inverted optical microscopy. This enables the study of electrochemical properties in samples that are transparent, opaque, soft or hard.
The perfect platform for fundamental electrochemistry
The study of the electrochemistry of batteries, fuel cells, sensors, and corrosion is a rapidly growing field, yet many AFMs do not directly address their unique needs. Park NX12 offers the functionality and flexibility chemistry researchers require by giving them one simple, easy-to-use platform with all the tools they need, including:
- Versatile and easy-to-use electrochemistry cells
- Environmental control options for inert gas and humidity
- Inverted optical microscope (IOM)
- Bi-potentiostat compatibility
Researchers can utilize the Park NX12 platform for various electrochemical applications:
- Scanning Electrochemical Microscopy (SECM)
- Scanning Electrochemical Cell Microscopy (SECCM)
- Electrochemical Atomic Force Microscopy (EC-AFM)
Easy optical access with motorized focus stage
- The system allows for top, side, and bottom optical access to the probe from various angles during measurements. This broad optical access combined with the device’s modular design also allows for optical or nano-optical add-ons.
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