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RMS SPM & SPM Meeting 2020 will take place in a virtual format, 3-4 November, 2020. Park Systems is proud to be a sponsor of the conference!

RMS SPM & SPM 2020 represents an exciting opportunity to explore the latest developments in atomic force microscopies and scanning probe microscopies. From the study of calcium dynamics in cardiac cells to the electrical imaging of graphene and 3D printing at the nanoscale, we aim to showcase the diversity of the state of the art in SPM techniques.

  • Event Dates: 3-4 November, 2020
  • Venue: University of Sheffield
 

Join our 2 exciting talks:

1. Technical Talk: "Park Systems – The NX Generation of AFMs" presented by Dr. Satyam Ladva - Sales Manager, Park Systems UK

2. Workshop: "Nailing down Teflon Molecules : High Resolution AFM imaging for Polymer Science" presented by Dr. Vladimir Korolkov - Senior Application Scientist, Park Systems UK

Please see the abstracts below.

 

About the SPM meeting:

The SPM Meeting is held annually and provides an excellent forum for the community to meet and discuss the latest advances in the field. With an exhibition alongside organized social activities, it is one of the most important events in the UK for scanning probe microscopy users, for PhD students and well-seasoned microscopists alike.

Link: https://www.rms.org.uk/rms-afm-spm-meeting-2020.html


Park Systems – The NX Generation of AFMs by Dr Satyam Ladva*, Dr Vladimir Korolkov

*This email address is being protected from spambots. You need JavaScript enabled to view it.

Atomic Force Microscopes have been a staple of research activity since their first implementation in 1986 by the team of Noble Prize winner Prof. Gerd Binnig, Prof. Christoph Gerber and the late Prof. Calvin Quate.

Whilst the earliest implementations of this technique lent itself to topographical and force-based research, upon the precept of a vibrating cantilever physically interacting with a sample surface, technological evolution has dictated that a more versatile approach to AFM would soon be needed.

Fast forward 35 years and what you now have are a myriad of AFM companies all with the aforementioned topographical measurement capabilities, many with strong nanomechanical capabilities and some still with good electrical measurement abilities amongst other techniques. Effectively, this has meant that a good AFM is now no longer one that can simply perform topographical measurements. A good AFM is now one that can perform a variety of high-level measurements akin to a scanning probe multi-lab based system, whilst being easy to use.

Such a system is exactly how one would describe Park Systems’ NX-series of AFMs.

In addition to our high resolution and stable single nm data, an outcome stemming from our very low noise XY and Z position detectors and 2D flexure guided scanners, Parks patented Pinpoint™ technology also allows for highly controllable nanomechanical and conductive measurements to be performed on both hard and soft samples. Coupled with our third mode of operation (True non-contact mode™, in addition to conventional contact and tapping modes), our system also has the slightly uncommon capability of performing measurements in both air and liquid environments repeatably – with a specially designed system also allowing for hi-vacuum measurements.

Whilst the NX-series of AFMs, much like its predecessors the XE series, have the capability of acquiring a range of information simply from changing a couple of accessories, its real distinction lies in the automation capabilities. Its Smartscan™ software, with Stepscan™ automation, coupled with hardware developments including motorized stages and slide-on-head design, allows for a fully software integrated AFM which can acquire high resolution data, reproducibly, without needing much AFM expertise from the user. Effectively, the definition of a modern AFM.

Sailboats on Water Presentation 4


Nailing down Teflon Molecules : High Resolution AFM imaging for Polymer Science by Dr Vladimir Korolkov

Various macroscopic properties of polymers are strongly influenced by packing and conformation of individual macromolecules as well as their monomer composition. Therefore, being able to resolve individual polymer chains in real space is crucial in understanding the overall structure of polymers.

In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape. Both high resolution and high-speed scanning capabilities of Park Systems NX20 AFM will be demonstrated on the real-world polymer sample.

Meetings & Exhibits