Park Systems, the leading atomic force microscope (AFM) and nano-metrology solutions partner for the most accurate AFM result, will exhibit at 2013 E-MRS Spring Meeting in Strasbourg, France from May 28th to 30th. Please visit us at Booth #1 and learn about what makes Park NX10 a long-awaited and game-changing product from Park. Park NX10, the most accurate AFM, features the industry's only True Non-Contact AFM with industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. 

Park AFM symposium will be held from 15:00 to 16:00 on Tuesday, May 28th. A special gift box will be provided to all the participants registered for the symposium. Online registration is due by May 23rd (please, e-mail to matt.shin@parkAFM.com). For more information about the symposium, please visit us at www.parkAFM.com

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