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Park Systems and Rexco, in cooperation with JEOL, will hold the “Electron Microscope Workshop” on July 4th & 6th. The workshop will provide information about various Microscope and Technology such as SEM, TEM and AFM, etc. Park Systems is especially planning to introduce the Park Systems AFM and its latest technology. The entire event is open to all interested parties and includes lunch.

Organized by the Electronic Device Failure Analysis Society (EDFAS), an ASM International Affiliate Society, ISTFA has become a premier event for engineers and other members of the failure analysis community to explore the latest research and tools available to facilitate their work.


1. Event Dates: July 4th, 2017


2. Event Dates: July 6th, 2017


User Meeting