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Ferroelectric #Materials Electical&Electronics CVD small_scan MultiLayerCeramicCapacitor Stiffness Annealing PinPointMode blended polymers SFAs ring shape Perovskite Device HardDisk MechanicalProperties Ceramics Patterns LithiumNiobate Thermal MechanicalProperty solar_cell FrictionalForceMicroscopy FailureAnalysis MolecularSelfAssembly AtomicLayer suspended_graphene Formamidinium_lead_iodide rubber Korea ito_film NTU Laser INSP Anneal
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Perovskite
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36A Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 4μm×4μm
- Scan Rate: 0.3Hz
- Pixel: 512×256