Park Systems NX 10 Screen Shot  SmartScan is the next step in transformation for AFM equipment and Park Systems is providing this upgrade at no cost to all of our e...

Promenergolab LLC Press Release   Nov 10, 2014 Suwon, KoreaPark Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the appoin...

LDPE characterized by PinPoint Nanomechanical  PinPoint™ Nanomechanical acquires images simultaneously and in real-time by taking the high speed force-distance curv...

High resolution topography image of polymer fiber network collected using True Non-Contact™ mode. The image shows the interwoven network of polymer fibers  Park Ana...

Keibock Lee, Park Systems President The live demos are a great way for us to offer education on Park Atomic Force Microscopy Imaging to further enhance the user experien...

Dr. Rigoberto Advincula, Professor at Case Western Reserve University, Director of the PETRO Case Consortium at CWRU. The demanding applications of materials for th...

Park Systems XE7-CR "Park AFM meets our rigid requirements for accurate measurements at the highest nanoscale resolution at a price we can afford."Dr. Gwo-Ching Wang, Pr...

Park NX Wafer Atomic Force Mircroscope "Park NX Wafer, bare wafer ADR is the most advanced, fully automated defect review solution available -designed for leaders in Se...