News
Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX-HDM, a fully automated automatic defect review ...
Welcome to Park Q1, 2013 Newsletter
Featured Application Featured Product News and Events Upcoming Exhibitions
Fe...
Park Systems announces the debut of the Park XE7, an affordable, research-grade Atomic Force Microscope (AFM). This new product, which includes flexible sample handling, ...
10
Dec 2012'
Press-Release
Santa Clara, California, December 10, 2012
Park XE-Bio, the leading atomic force microscopy (AFM) system for cell biology imaging, was featured in the Journal of E...
3
Dec 2012'
Press-Release
Closed-loop XY scan with dual servo achieves the unprecedented accuracy and orthogonality in AFM scans
Santa Clara, California, USA, December 3, 2012
Park S...
Welcome to Park Q4, 2012 Newsletter
Featured Application Featured Product News and Events Upcoming Exhibitions Park Research ...
Park Systems introduces the NX20, a high-end, large sample atomic force microscope (AFM) for failure analysis (FA) and quality assurance (QA) laboratories that will benef...
26
Oct 2012'
Press-Release
Industry leading low-noise Z detector is used for the default AFM topography signal.
Santa Clara, California, October 26, 2012
Park Systems announces True Sample...
1
Oct 2012'
Press-Release
Santa Clara, California, October 1, 2012
Park Systems, the atomic force microscopy leader, and Emphor free zone company (Dubai, UAE), a leading technology integrator and...
Welcome to Park Q3, 2012 Newsletter
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