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In this webinar, we present how Park Systems’ PinPoint mode measures high-speed force-distance curves for each pixel which allows to study the mechanical properties like Young’s modulus, adhesion, or mechanical energy dissipation on a local scale.

 
 

Make the Most out of your Interactions: the Benefits of PinPoint Nanomechanical AFM

 

Wednesday, 14 July, 2021

  • 10:00 am – 11:30 am
    (GMT)
    London, Dublin
  • 11:00 am – 12:30 pm
    (CET)
    Berlin, Paris, Rome
  • 18:00pm – 19:30 pm
    [UTC+9]
    Seoul, Tokyo

 

 

Abstract:
Noval high-tech materials share a common denominator: a careful design in the nanometer range. From functional polymer composites to wearable electronics or 2D materials, local variations in mechanical properties dictate the macroscopic properties. Here, atomic force microscopy offers more analytic insights beyond mere topography. In this webinar, we present how Park Systems’ PinPoint mode measures high-speed force-distance curves for each pixel which allows to study the mechanical properties like Young’s modulus, adhesion, or mechanical energy dissipation on a local scale. Moreover, PinPoint mode enables facile integration of other modes as conductive atomic force microscopy or piezo force microscopy and thus offers a holistic approach to nanoscale characterization.

Presented By : 
Alexander Klasen, Principle Scientist at Park Systems Europe, Mannheim, Germany
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Alexander received his diploma in Chemistry from the Johannes Gutenberg University Mainz and doctorate from Max-Plank-Institute for Polymer Science, where he fabricated and characterized perovskite solar cells. His expertise spans the nanoscale functioning of thin films and interface optimization of semiconducting metal oxides using AFM-based methods like C-AFM and KPFM as a main analytical tool. Prior to joining Park Systems, he was a postdoctoral research fellow of the same institute. At Park Systems, he acts as Principle Scientist to support research and industrial collaborations.

 

 

 

Park Lectures - Park Atomic Force Microscope