| 고객문의   Global

​ As interest in energy-related fields increases, this study delves into the pivotal role of Atomic Force Microscopy (AFM) in propelling forward innovations in energy storage technologies. AFM's capability for nanoscale imaging and characterization is harnessed in battery research, unraveling intricate details of electrodes and electrolytes to enhance performance and lifespan. The analysis of material's properties using AFM aids in the meticulous selection and design of materials for energy storage devices. Moreover, AFM's application in studying thin film materials for solar cells contributes to improving efficiency and durability in photovoltaic systems. In fuel cell research, AFM plays a crucial role in optimizing performance and longevity by characterizing membrane structures. The study of nanogenerators and investigation into nanomaterial properties for advanced energy storage systems further underscore AFM's significance in pushing the boundaries of energy storage technologies. In essence, AFM emerges as a powerful and versatile tool, steering progress in the intricate landscape of energy storage technologies.

​ In this talk, we will discuss different perovskite fabrication processes and relevant composition adjustments to achieve desired applications such as solar cells, LEDs, and photo-detectors. Different modes of atomic force microscopy were used to deepen perovskite investigation.

​ 電子・物理・機械・化学・生物と、研究・教育のバックグラウンドが大きく異なる幅広いユーザを対象とした学内共通設備としてPark NX10・AFM装置を導入した経緯と本学での運用方針を説明します。特に「研究室に配属されたばかりのB4や大学院生」が主なユーザとなる状況を強く意識しております。 次に、装置の運用管理と利用にあたり、「ビギナーユーザに教える管理者」および「ビギナーユーザ」、それぞれの立場からPark NX10の主にユーザフレンドリーな特徴や汎用性の高さ、メーカー様からのサポート体制等を中心に紹介をさせていただきます。

Imaging spectroscopic ellipsometry involves combining the sensitivity of ellipsometry to detect changes in film thickness and optical properties with the imaging capabilities of optical microscopy. This unique combination enables thin film metrology as well as the determination of optical properties at the microscopic scale. Lead-halide perovskite solar cells are very promising from a performance point of view in the fields of photovoltaics, optoelectronics, light-emitting diodes, lasers, and photodetectors. Most of these applications require a deep understanding of the optical properties of the material. It is important to note that the grain size must be related to the optical properties, as the film may contain crystalline and amorphous portions depending on the crystallization method. A critical aspect is stability against environmental influences. One focus of the webinar will be on the extraction of clear spectra from samples with local layer thickness variations, and another will be the assessment of material stability at the microscopic scale by comparing Delta and Psi micro-maps at variable wavelengths. The webinar will be completed with a demonstration of the instrument highlighting the new sweep mode—a game changer in ellipsometry?

​薄膜の厚さと光学特性は、マイクロおよびナノエレクトロニクス デバイスの性能と信頼性にとって重要です。 サンプルのサイズが小さくなっていくにつれ、小さな構造物の厚さと光学特性を測定することが求められますが、従来の方法では解決することが難しいです。 イメージングエリプソメトリーは、ミクロンスケールの構造上の表面や膜の特性を評価するための高速かつ非破壊的な方法を提供し、 材料の研究開発にとって貴重なツールとなります。 本ウェビナーでは、イメージングエリプソメトリーの測定原理、装置概要、解析方法、応用事例などを紹介させていただきます。