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HOPG IIT-chennai Cross-section University_of_Regensburg Granada PUR SFAs SelfAssembly molecules AM_KPFM CHRYSALIS_INC HexagonalBoronNitride Potential ReflexLens solar_cell Ucl LiquidImaging PtfeFilter SmallScan ShenYang IRDetector Phosphide Pipette Composite Indium_tin_oxide Spincast Polyethylene HfO2 Pores Ferroelectric Tin sulfide HDD Laser ConductiveAFM Gold
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Semiconductor device, Failure analysis
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 11μm×11μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Sample bias: -0.5V