Park Probe Store
How to choose an AFM probe
For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.
Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
PPP-NCHR | 42 | 330 | Nanosensors |
▪ Non-contact cantilever with high resonant frequency ▪ Backside reflex coating (AI) |
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The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.
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SSS-NCHR | 42 | 330 | Nanosensors |
▪ Non-contact cantilever with sharp tip ▪ Backside reflex coating (Al) ▪ Tip radius: 2 nm typical, < 5 nm max. |
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PPP-NCH | 42 | 330 | Nanosensors | ▪ Non-contact cantilever with high resonant frequency | Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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SSS-NCH | 42 | 330 | Nanosensors |
▪ Non-contact cantilever with sharp tip ▪ Tip radius: 2 nm typical, < 5 nm max. |
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PPP-NCLR | 48 | 190 | Nanosensors |
▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) |
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SSS-NCLR | 48 | 190 | Nanosensors |
▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) ▪ Tip radius: 2 nm typical, < 5 nm max. |
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PPP-NCL | 48 | 190 | Nanosensors | ▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz | Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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SSS-NCL | 48 | 190 | Nanosensors |
▪ Non-contact cantilever with sharp tip ▪ Tip radius: 2 nm typical, < 5 nm max. |
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NSC15/AL BS | 40 | 325 | Mikromasch |
▪ Non-contact cantilever ▪ Backside reflex coating |
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Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also good for non-contact AFM.
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AR5-NCH | 42 | 330 | Nanosensors | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) | Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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AR5-NCLR | 48 | 190 | Nanosensors | ▪ Non-contact cantilever with high aspect ratio tip (>5:1)▪ Backside reflex coating | Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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AR5-NCL | 48 | 190 | Nanosensors | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) | Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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AR5-NCHR | 42 | 320 | Nanosensors |
▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) |
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AR5T-NCHR | 42 | 330 | Nanosensors |
▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ High aspect ratio portion of the tip tilted 13° |
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AR5T-NCH | 42 | 330 | Nanosensors |
▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ High aspect ratio portion of the tip tilted 13° |
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OMCL-AC160TS | 26 | 300 | Olympus |
▪ Non-contact cantilever with high resonant frequency ▪ backside reflex coating ▪ Tip end visible from top |
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ATEC-NC | 45 | 335 | Nanosensors |
▪ Non-contact cantilever ▪ Tip visibility from top |
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These tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever allowing it to be the only probe to offer real tip visibility from the top even if the probe is tilted.
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ACTA | 37 | 300 | AppNano |
▪ Non-contact cantilever ▪ Backside reflex coating (Al) |
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HARTA-12-2 | 40 | 300 | AppNano |
▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ High aspect ratio portion of the tip tilted 12° ▪ Package of 5 (EA) |
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HARTA-12-4 | 40 | 300 | AppNano |
▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 12° ▪ Typical tip length: ~4 um ▪ Package of 5 (EA) |
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HARTA-12-6 | 40 | 300 | AppNano |
▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 12° ▪ Typical tip length: ~6 um ▪ Package of 5 (EA) |
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EBD2-100A | 40 | 320 | nanotools |
▪ Non-contact cantilever with high aspect ratio tip (>6:1)
(HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~2 um ▪ Package of 5 (EA) |
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EBD4-200A | 40 | 320 | nanotools |
▪ Non-contact cantilever with high aspect ratio tip (>10:1)
(HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~4 um (max.) ▪ Package of 5 (EA) |
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EBD6-400A | 40 | 320 | nanotools |
▪ Non-contact cantilever with high aspect ratio tip (>10:1)
(HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~6 um (max.) ▪ Package of 5 (EA) |
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EBD8-600A | 40 | 320 | nanotools |
▪ Non-contact cantilever with high aspect ratio tip (>10:1)
(HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~8 um (max.) ▪ Package of 5 (EA) |
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MCNT-100™ Park AAFM | 40 | 320 | nanotools |
▪ Non-contact cantilever with narrow width and high aspect ratio
tip (HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 12° ▪ Typical tip length: ~100 nm ▪ Package of 5 (EA) |
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MCNT-150™ Park AAFM | 40 | 320 | nanotools |
▪ Non-contact cantilever with narrow width and high aspect ratio
tip (HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 12° ▪ Typical tip length: ~150 nm (max.) ▪ Package of 5 (EA) |
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M-CNT-300 | 40 | 320 | nanotools |
▪ Non-contact cantilever with narrow width and high aspect ratio
tip (HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 12° ▪ Typical tip length: ~300 nm (max.) ▪ Package of 5 (EA) |
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M-CNT-400 | 40 | 320 | nanotools |
▪ Non-contact cantilever with narrow width and high aspect ratio
tip (HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 12° ▪ Typical tip length: ~400 nm (max.) ▪ Package of 5 (EA) |
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M-CNT-500 | 40 | 320 | nanotools |
▪ Non-contact cantilever with narrow width and high aspect ratio
tip (HDC/DLC) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 12° ▪ Typical tip length: ~500 nm (max.) ▪ Package of 5 (EA) |
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HI'RES-C14/Cr-Au | 5 | 160 | MikroMasch |
▪ Non-contact cantilever with low resonant frequency ▪ Backside reflective coating (Au) ▪ Tip radius: 1 nm typical |
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Scout 70 | 2 | 70 |
▪ Non-contact cantilever with high resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm |
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Scout 150 | 18 | 150 |
▪ Non-contact cantilever with high resonant frequency ▪ Backside reflex coating (Al) (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm |
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Scout 350 | 42 | 350 |
▪ Non-contact cantilever with high resonant frequency ▪ Backside reflex coating (Al) (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm |
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PPP-CONTSCR | 0.2 | 25 | Nanosensors |
▪ Contact cantilever ▪ Backside reflex coating (Al) |
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The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
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NSC36/Al BS | 1 2 0.6 |
90 130 65 |
Mikromasch |
▪ Contact cantilever ▪ Backside reflex coating (Al) ▪ 3 cantilevers on a chip |
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PNP-DB | 0.48 0.03 |
67 17 |
Nanoworld |
▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ 2 cantilevers on a chip |
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NSC36/HARD/AI BS | 1 2 0.6 |
90 130 65 |
Mikromasch |
▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ 3 cantilevers on a chip ▪ Hard Diamond-Like-Carbon coated tip |
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PNP-DB | 0.48 0.03 |
67 17 |
Nanoworld |
▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ 2 cantilevers on a chip |
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PNP-TR | 0.32 0.08 |
67 17 |
Nanoworld |
▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ 2 triangular cantilevers on a chip |
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PPP-LFMR | 0.2 | 23 | Nanosensors |
▪ Contact cantilever with high sensitivity for lateral/frictional
force measurement ▪ Backside reflective coating (Al) |
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CDT-NCHR | 80 | 400 | Nanosensors |
▪ Cantilever suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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PPP-EFM | 2.8 | 75 | Nanosensors |
▪ Probe for SCM/DC-EFM/PFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand |
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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images. The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
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25Pt300B | 18 | 14 | Rocky Mountain Nanotechnology |
▪ Contact cantilever for conductive AFM(C-AFM)/SCM ▪ Solid platinum tip ▪ Recommended for high voltage/current application above ±10 V or 1 µA ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type chip carrier |
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The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.
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CDT-CONTR | 0.5 | 20 | Nanosensors |
▪ Contact cantilever for conductive AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
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PPP-CONTSCPT | 0.2 | 25 | Nanosensors |
▪ Cantilever for DC-EFM/PFM/C-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
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AD-2.8-AS | 2.8 | 65 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type on teflon-coated chip carrier |
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AD-40-AS | 40 | 180 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type on teflon-coated chip carrier |
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AD-2.8-SS | 2.8 | 65 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type on teflon-coated chip carrier |
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AD-40-SS | 40 | 180 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ▪ Mounted type on teflon-coated chip carrier |
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25Pt300B | 18 | 20 | Rocky Mountain Nanotechnology |
▪ Contact cantilever for conductive AFM(C-AFM)/SCM ▪ Solid platinum tip ▪ Recommended for high voltage/current application above ±10 V or 1 µA ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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NSC18/Cr-Au | 2.8 | 75 | Mikromasch |
▪ Contact cantilever for conductive AFM(C-AFM) ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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SD-R30-NCH | 42 | 330 | Nanosensors |
▪ Probe for nanomechanical modes (F-d/PinPoint) on stiff samples ▪ Typical tip length:125 µm ▪ Typical tip radius: 30nm ±10nm ▪ Tip shape: Parabolic tip shape ▪ Tip size and shape make it suitable for nanomechanical quantitative measurements |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
SD-R30-FM | 2.8 | 75 | Nanosensors |
▪ Probe for nanomechanical modes (F-d/PinPoint) on soft samples ▪ Typical tip length:125 µm ▪ Typical tip radius: 30nm ±10nm ▪ Tip shape: Parabolic tip shape ▪ Tip size and shape make it suitable for nanomechanical quantitative measurements |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
SD-R30-CONT | 0.2 | 13 | Nanosensors |
▪ Probe for nanomechanical modes (F-d/PinPoint) on soft samples ▪ Typical tip length:450 µm ▪ Typical tip radius: 30nm ±10nm ▪ Tip shape: Parabolic tip shape ▪ Tip size and shape make it suitable for nanomechanical quantitative measurements |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
NC-LC | 100 | 450 |
▪ Cantilever with high spring constant for nanomechnical
measurement and Conductive AFM ▪ Backside reflex coating (Cr-Au) ▪ Tip shape: cone ▪ Single crystal diamond tip ▪ Typical tip length: ~175 nm ▪ Typical tip radius: ~20 nm |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
FM-LC | 8 | 100 | Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
PPP-FMR | 2 | 75 | Nanosensors |
▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: |
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DT-FMR | 6.2 | 105 | Nanosensors |
▪ Backside reflex coating ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm |
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PPP-NCSTR | 7.4 | 160 | Nanosensors |
▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: |
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NSC36/Al BS | 1 2 0.6 |
90 130 65 |
Mikromasch |
▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: ▪ 3 cantilevers on a chip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NSC14/HARD/AI BS | 5 | 160 | Mikromasch |
▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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PPP-CONTSCPt | 0.2 | 25 | Nanosensors |
▪ Cantilever for DC-EFM/PFM/C-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NSC36/Cr-Au | 1 2 0.6 |
90 130 65 |
Mikromasch |
▪ Cantilever for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ 3 cantilevers on a chip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NSC14/Cr-Au | 5 | 160 | Mikromasch |
▪ Cantilever for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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PPP-NCSTAu | 7.4 | 160 | Nanosensors |
▪ Cantilever for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Au |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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PPP-EFM | 2.8 | 75 | Nanosensors |
▪ Cantilever for DC-EFM/PFM/SCM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
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NSC36/Pt | 1 2 0.6 |
90 130 65 |
MikroMasch |
▪ Cantilever for DC-EFM/PFM ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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ElectriMulti75-G | 3 | 75 | Budget Sensors |
▪ Cantilever for electrical modes(EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Conductive tip for electrical application, coated with Cr-Pt |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Rotated Monolithic silicon probe
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SPARK 70 Pt | 2 | 70 |
▪ Probe for KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
SPARK 150 Pt | 18 | 150 |
▪ Probe for KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
SPARK 350 Pt | 42 | 350 |
▪ Probe for KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Glass NanoPipette |
▪ Pipette for SICM ▪ Borosilicate glass pipette ▪ Pipette opening diameter: d = ~100nm ▪ Minimum order quantities are 10ea |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Pt-Ir |
▪ 0.25 mm diameter Pt-Ir wire ▪ Sharpened tip end for STM |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
PPP-MFMR | 2.8 | 75 | Nanosensors |
▪ Cantilever for MFM ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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PPP-LC-MFMR | 2.8 | 75 | Nanosensors |
▪ Cantilever for MFM ▪ Backside reflex coating (Al) ▪ Soft magnetic coating on the tip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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PPP-LM-MFMR | 2.8 | 75 | Nanosensors |
▪ Cantilever for MFM ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip with reduced magnetic moment compared to PPP-MFMR |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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SSS-MFMR | 2.8 | 75 | Nanosensors |
▪ Cantilever for high resolution MFM ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip with reduced magnetic moment compared to PPP-MFMR ▪ guaranteed tip radius of curvature < 15 nm |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NSC18/Co-Cr/Al BS | 2.8 | 75 | MikroMasch |
▪ Cantilever for MFM ▪ Backside reflective coating (Al) ▪ Tip is coated with Co-Cr |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NanoThermal-10 | 0.25 | Kelvin Nanotechnology |
▪ Cantilever with thermo-coupled tip for SThM ▪ Tip made of NiCr and Pd ▪ Mounted type only ▪ Package of 10 (EA) |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NanoThermal-5 | 0.25 | Kelvin Nanotechnology |
▪ Cantilever with thermo-coupled tip for SThM ▪ Tip made of NiCr and Pd ▪ Mounted type only ▪ Package of 5 (EA) |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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DT-NCHR | 80 | 400 | Nanosensors |
▪ Cantilever with high force constant for Lithography, Backside
reflex coating ▪ Diamond-coated tip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
NANOSENSORS™ DT-NCHR probes are designed for
non-contact mode or tapping mode AFM (also known as: attractive or
dynamic mode). This probe type combines high operation stability
with outstanding sensitivity and fast scanning ability.
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ElectriMulti75-G | 3 | 75 | Budget Sensors |
▪ Cantilever for electrical modes(EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Conductive tip for electrical application, coated with Cr-Pt |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Rotated Monolithic silicon probe
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CDT-CONTR | 0.5 | 20 | Nanosensors |
▪ Contact contact cantilever for Lithography based on oxidation,
Backside reflex coating ▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip carrier |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
NANOSENSORS™ CDT-CONTR probes are designed for
contact mode (repulsive mode) SPM imaging. For applications that
require a wear resistant and an electrically conductive tip we
recommend this type. Some applications are Tunneling AFM and Scanning
Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped
and the total resistance measured in contact to a platinium surface is
< 10 kOhm.
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CDT-NCHR | 80 | 400 | Nanosensors |
▪ Cantilever with high resonant frequency for Lithography, Backside
reflex coating ▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip carrier |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
NANOSENSORS™ CDT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
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25Pt300B | 18 | 14 | - |
▪ Contact cantilever made of solid platinum ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.
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NM-RC-SEM | 350 | 750 |
▪ Cantilever with high force constant for Nanoindentation ▪ Tip shape: cone ▪ Single crystal diamond tip ▪ Typical tip length: ~500 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type only ▪ For exact values of tip height & radius and half-cone angle, SEM image data is provided |
Request for Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
BL-AC40TS | 0.09 | 110 | Olympus |
▪ Cantilever for imaging soft samples ▪ Backside reflective coating (Au) BioLever Mini |
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PNP-DB | 0.48 0.06 |
67 17 |
Nanoworld |
▪ Contact cantilever made of Silicon Nitride ▪ Backside reflex coating (Au) ▪ 2 cantilevers on a chip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
The Pyrex-Nitride probes have silicon nitride cantilevers witd very low force constants and integrated oxide sharpened, pyramidal tips witd a height of 3.5 µm. The tip is located 4 µm behind tde free end of tde cantilever. This probe series features a support chip tdat is made of Pyrex. Two chip versions are available: The DB series witd rectangular / diving board cantilevers and tde TR series having triangular cantilevers. Botd sides of tde chip have identical cantilevers.
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PNP-TR | 0.32 0.08 |
67 17 |
Nanoworld |
▪ Contact cantilever made of Silicon Nitride ▪ Backside reflex coating (Au) ▪ 2 triangular cantilevers on a chip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
The Pyrex-Nitride probes have silicon nitride cantilevers witd very low force constants and integrated oxide sharpened, pyramidal tips witd a height of 3.5 µm. The tip is located 4 µm behind tde free end of tde cantilever. The probe series features a support chip tdat is made of Pyrex. The TR series features two different triangular cantilevers. Botd sides of tde chip have identical cantilevers.
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DNP-S | 0.175 0.06 0.12 0.03 |
50 16 40 12 |
Bruker |
▪ Contact cantilever for imaging biological samples ▪ 4 triangular cantilevers on a chip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Premium Contact Mode or Fluid TappingMode imaging and force measurement probes, sharpened for higher-resolution. Unmounted for BioScope / Dimension AFMs.
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NSC36/Cr-Au | 1 2 0.6 |
90 130 65 |
Mikromasch |
▪ Cantilever for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ 3 cantilevers on a chip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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QP-BioAC | 0.3 0.1 0.06 |
90 50 30 |
Nanosensors |
▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (AI) ▪ 3 triangular cantilevers on a chip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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R-NCLR 8M for 3DM | 48 | 190 | Nanosensors |
▪ Mounted R-NCLR cantilever for 3DM ATX ▪ Backside reflex coating ▪ Compatible with 3DM ATX ▪ Cassette of 8 (EA) |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NCHR 8M for 3DM | 42 | 330 | Nanosensors |
▪ Mounted PPP-NCHR cantilever for 3DM ATX ▪ Backside reflex coating ▪ Compatible with 3DM ATX ▪ Cassette of 8 (EA) |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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NCHR 12M for ATX | 42 | 330 | Nanosensors |
▪ Mounted PPP-NCHR cantilever for industrial systems with ATX ▪ Backside reflex coating ▪ Compatible with standard ATX ▪ Cassette of 12 (EA) |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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DT-CONTR | 2.8 | 75 | Nanosensors |
▪ Contact cantilever for AFP ▪ Backside reflex coating ▪ Diamond-coated tip |
Request for Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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OMCL-AC240TS | 2 | 70 | Olympus |
▪ Non-contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) |
Request Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자
에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 | |
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PPP-NCHR (10ea.) | |||
610-1051 | ▪ Non-contact cantilever with high resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 551,000 |
610-0051 | Unmounted Type | 437,000 | |
SSS-NCHR (10ea.) | |||
610-1056 | ▪ Non-contact cantilever with super sharp tip ▪ Backside reflex coating (Al) ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,248,000 |
610-0056 | Unmounted Type | 1,070,000 | |
BL-AC40TS (10ea.) | |||
610-1049 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Effective tip length: ~3.5 μm (total 7 μm) ▪ Typical tip radius: ~10 nm ▪ k = ~0.09 N/m, f = ~110 kHz |
Mounted Type | 921,000 |
610-0049 | Unmounted Type | 843,000 | |
OMCL-AC160TS (10ea.) | |||
610-1183 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Tip shape: Sharpened tetrahedral on zero setback position ▪ Typical tip length: ~14 μm ▪ Typical tip radius: ~7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 507,000 |
610-0183 | Unmounted Type | 429,000 | |
ATEC-NC (10ea.) | |||
610-1020 | ▪ Non-contact cantilever ▪ Tip shape: Tetrahedral tip on zero setback position ▪ Typical tip length: 15 - 20 μm ▪ Typical tip radius: <10 nm ▪ k = ~45 N/m, f = ~335 kHz |
Mounted Type | 713,000 |
610-0020 | Unmounted Type | 636,000 | |
ACTA (10ea.) | |||
610-1201 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Typical tip length: 14 - 16 μm ▪ Typical tip radius: ~6 nm ▪ k = ~37 N/m, f = ~300 kHz |
Mounted Type | 500,000 |
610-0201 | Unmounted Type | 422,000 | |
PPP-NCH (10ea.) | |||
610-1125 | ▪ Non-contact cantilever with high resonant frequency ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 591,000 |
610-0125 | Unmounted Type | 461,000 | |
SSS-NCH (10ea.) | |||
610-1081 | ▪ Non-contact cantilever with super sharp tip ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,361,000 |
610-0081 | Unmounted Type | 1,167,000 | |
PPP-NCLR (10ea.) | |||
610-1105 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 629,000 |
610-0105 | Unmounted Type | 500,000 | |
SSS-NCLR (10ea.) | |||
610-1106 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,361,000 |
610-0106 | Unmounted Type | 1,083,000 | |
PPP-NCL (10ea.) | |||
610-1095 | ▪ Non-contact cantilever with low resonant frequency ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 629,000 |
610-0095 | Unmounted Type | 500,000 | |
SSS-NCL (10ea.) | |||
610-1094 | ▪ Non-contact cantilever with low resonant frequency ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,248,000 |
610-0094 | Unmounted Type | 1,070,000 | |
NSC15/Al BS (10ea.) | |||
610-1011 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k = ~40 N/m, f = ~325 kHz |
Mounted Type | 389,000 |
610-0011 | Unmounted Type | 312,000 | |
AR5-NCHR (10ea.) | |||
610-1055 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,569,000 |
610-0055 | Unmounted Type | 1,374,000 | |
AR5-NCH (10ea.) | |||
610-1127 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,418,000 |
610-0127 | Unmounted Type | 1,248,000 | |
AR5-NCLR (10ea.) | |||
610-1089 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,418,000 |
610-0089 | Unmounted Type | 1,248,000 | |
AR5T-NCHR (10ea.) | |||
610-1060 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 2,256,000 |
610-0060 | Unmounted Type | 2,062,000 | |
AR5T-NCH (10ea.) | |||
610-1126 | - Discontinued by manufacturer. AR5T-NCHR (610-0060/610-1060) is recommended | Mounted Type | |
610-0126 | Unmounted Type | ||
HARTA-12-2 (5ea.) | |||
605-1123 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,171,000 |
605-0123 | Unmounted Type | 2,074,000 | |
HARTA-12-4 (5ea.) | |||
605-1124 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~4 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,171,000 |
605-0124 | Unmounted Type | 2,074,000 | |
HARTA-12-6 (5ea.) | |||
605-1138 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~6 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,171,000 |
605-0138 | Unmounted Type | 2,074,000 | |
EBD2-100A (5ea.) | |||
605-1132 | ▪ Non-contact cantilever with high aspect ratio tip (>6:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~2 μm ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
605-0132 | Unmounted Type | 1,971,000 | |
EBD4-200A (5ea.) | |||
605-1139 | ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~4 μm (max.) ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
605-0139 | Unmounted Type | 1,971,000 | |
EBD6-400A (5ea.) | |||
605-1134 | ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~6 μm (max.) ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
605-0134 | Unmounted Type | 1,971,000 | |
MCNT-100 (5ea.) | |||
605-1156 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~100 nm ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 7,290,000 |
605-0156 | Unmounted Type | 7,128,000 | |
MCNT-150 (5ea.) | |||
605-1157 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~150 nm ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 7,290,000 |
605-0157 | Unmounted Type | 7,128,000 | |
MCNT-300 (5ea.) | |||
605-1158 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~300 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
605-0158 | Unmounted Type | 6,480,000 | |
MCNT-400 (5ea.) | |||
605-1159 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~400 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
605-0159 | Unmounted Type | 6,480,000 | |
MCNT-500 (5ea.) | |||
605-1160 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~500 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
605-0160 | Unmounted Type | 6,480,000 | |
Hi'Res-C14/Cr-Au (5ea.) | |||
605-1155 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflective coating (Au) ▪ Typical spike length: 100 - 200 nm ▪ Typical tip radius: ~1 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 772,000 |
605-0155 | Unmounted Type | 707,000 | |
OMCL-AC240TS (10ea.) | |||
610-1184 | ▪ Non-Contact cantilever with low resonant frequency ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: 7 nm ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 507,000 |
610-0184 | Unmounted Type | 429,000 | |
PPP-XYNCSTR (10ea.) | |||
610-1280 | ▪ Non-contact/Tapping Mode cantilever ▪ Backside reflex coating (Al) ▪ Tip shape: 4-sided ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~7 nm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 591,000 |
610-0280 | Unmounted Type | 461,000 | |
ATEC-NCAu (10ea.) | |||
610-1209 | ▪ Non-contact cantilever ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral tip on zero setback position ▪ Tip coated with Cr-Au ▪ Typical tip length: 15 - 20 μm ▪ Typical tip radius: ~63 nm ▪ k = ~45 N/m, f = ~335 kHz |
Mounted Type | 1,466,000 |
610-0209 | Unmounted Type | 1,271,000 | |
EBD-24 (5ea.) | |||
605-1295 | ▪ Non-contact cantilever ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~24 μm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,442,000 |
605-0295 | Unmounted Type | 6,312,000 | |
240AC-NA (24 ea.) | |||
624-1297 | ▪ Non-Contact cantilever with low resonant frequency ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: <7 nm ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 1,044,000 |
624-0297 | Unmounted Type | 734,000 | |
Scout 70 (10ea.) | |||
610-1305 | ▪ Non-Contact cantilever with low resonant frequency ▪ Backside reflective coating (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm (<10 nm) ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 545,000 |
610-0305 | Unmounted Type | 416,000 | |
Scout 150 (10ea.) | |||
610-1315 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm (<10 nm) ▪ k = ~18 N/m, f = ~150 kHz |
Mounted Type | 545,000 |
610-0315 | Unmounted Type | 416,000 | |
Scout 350 | |||
610-1323 | ▪ Non-contact cantilever ▪ Backside reflex coating (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm (<10 nm) ▪ k = ~42 N/m, f = ~350 kHz |
Mounted Type | 676,000 |
610-0323 | Unmounted Type | 526,000 | |
ISC-125C40-R (5ea.) | |||
605-1312 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflex coating (Al) ▪ Typical spike length: ~7 μm ▪ Typical tip radius: <10 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 477,000 |
605-0312 | Unmounted Type | 364,000 | |
EBD-16 (5ea.) | |||
605-1276 | ▪ Non-contact cantilever with high aspect ratio tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~16 um ▪ k = ~40 N/m, f = ~320 kHz NOTE: Requires ESD-safe Package for EBD Tips (370-0413) for shipment. |
Mounted Type | 3,222,000 |
605-0276 | Unmounted Type | 3,108,000 | |
160AC-NG (10ea.) | |||
610-1322 | ▪ Probe suitable for tapping mode ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Typical tip length: ~14 μm ▪ Typical tip radius: <7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 477,000 |
610-0322 | Unmounted Type | 364,000 | |
PPP-CONTSCR (10ea.) | |||
610-1093 | ▪ Contact cantilever ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 551,000 |
610-0093 | Unmounted Type | 437,000 | |
NSC36/Al BS (10ea.) | |||
610-1001 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 416,000 |
610-0001 | Unmounted Type | 286,000 | |
NSC36/Hard/Al BS (10ea.) | |||
610-1004 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <20 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 507,000 |
610-0004 | Unmounted Type | 377,000 | |
PNP-DB (10ea.) | |||
610-1145 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Tip shape: Sharpened tetrahedral on zero setback position ▪ Typical tip length: ~14 μm ▪ Typical tip radius: ~7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 448,000 |
610-0145 | Unmounted Type | 318,000 | |
PNP-TR (10ea.) | |||
610-1146 | ▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ Tip shape: Pyramidal ▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz ▪ 2 triangular cantilevers on a chip |
Mounted Type | 448,000 |
610-0146 | Unmounted Type | 318,000 | |
PPP-LFMR (10ea.) | |||
610-1076 | ▪ Contact cantilever with high sensitivity for lateral/frictional force measurement ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~23 kHz |
Mounted Type | 629,000 |
610-0076 | Unmounted Type | 500,000 | |
OMCL-AC200TS (10ea.) | |||
610-1187 | ▪ Probe suitable for tapping ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: 7 nm ▪ k = ~9 N/m, f = ~150 kHz |
Mounted Type | 648,000 |
610-0187 | Unmounted Type | 519,000 | |
SHOCONA (10ea.) | |||
610-1108 | ▪ Contact cantilever ▪ Backside reflex coating (Al) ▪ Tip shape: Pyramidal ▪ Typical tip length: 14 - 16 μm ▪ Typical tip radius: <6 nm ▪ k = ~0.14 N/m, f = ~21 kHz |
Mounted Type | 551,000 |
610-0108 | Unmounted Type | 422,000 | |
200AC-NA (24 ea.) | |||
624-1296 | ▪ Probe suitable for tapping ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: <7 nm ▪ k = ~9 N/m, f = ~135 kHz |
Mounted Type | 1,044,000 |
624-0296 | Unmounted Type | 734,000 | |
3XC-NA (24 ea.) | |||
624-1298 | ▪ Probe suitable for contact or tapping mode ▪ Backside reflex coating (Al) ▪ Typical tip length: ~14 μm ▪ Typical tip radius: <7 nm ▪ k1 = ~0.3 N/m, f1 = ~17 kHz, k2 = ~9 N/m, f2 = ~150 kHz, k3 = ~2.5 N/m, f3 = ~75 kHz |
Mounted Type | 1,044,000 |
624-0298 | Unmounted Type | 734,000 | |
HQ:CSC17/Pt (15ea.) | |||
615-1320 | ▪ Probe suitable for contact mode ▪ Backside reflex coating (Cr/Pt-Ir5) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 624,000 |
615-0320 | Unmounted Type | 454,000 | |
HQ:CSC17/Cr-Au (15ea.) | |||
615-1233 | ▪ Probe suitable for contact, LFM and C-AFM ▪ Backside reflex coating (Cr-Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 15 μm ▪ Typical tip radius: <35 nm ▪ k = ~0.18 N/m, f = ~13 kHz |
Mounted Type | 624,000 |
615-0233 | Unmounted Type | 454,000 | |
PPP-FMR (10ea.) | |||
610-1110 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~2 N/m, f = ~75 kHz |
Mounted Type | 629,000 |
610-0110 | Unmounted Type | 500,000 | |
DT-FMR (10ea.) | |||
610-1077 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~6.2 N/m, f = ~105 kHz |
Mounted Type | 2,022,000 |
610-0077 | Unmounted Type | 1,828,000 | |
PPP-NCSTR (10ea.) | |||
610-1117 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 629,000 |
610-0117 | Unmounted Type | 500,000 | |
NSC36/Al BS (10ea.) | |||
610-1001 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 416,000 |
610-0001 | Unmounted Type | 286,000 | |
NSC14/Hard/Al BS (10ea.) | |||
610-1140 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <20 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 507,000 |
610-0140 | Unmounted Type | 377,000 | |
SD-R30-CONT (10ea.) | |||
610-1230 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 856,000 |
610-0230 | Unmounted Type | 778,000 | |
SD-R30-FM (10ea.) | |||
610-1229 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 856,000 |
610-0229 | Unmounted Type | 778,000 | |
SD-R30-NCH (10ea.) | |||
610-1228 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 856,000 |
610-0228 | Unmounted Type | 778,000 | |
MSS-Soft (5ea.) | |||
605-1254 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~250 nm ▪ Typical tip radius: <2 nm="" br="">▪ k = ~2.8 N/m, f = ~75 kHz ▪NOTE: Requires ESD-safe Package (370-0413) for EBD Tips for shipment. |
Mounted Type | 1,847,000 |
605-0254 | Unmounted Type | 1,782,000 | |
SSS-FMR (10ea.) | |||
610-1245 | ▪ Cantilever with force constant suitable for FMM with super sharp tip ▪ Backside reflex coating (Al) ▪ Typical tip radius: 2 nm (< 5 nm) ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,361,000 |
610-0245 | Unmounted Type | 1,167,000 | |
NSC19/Al BS (15ea.) | |||
615-1291 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Al) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k = ~0.5 N/m, f = ~65 kHz |
Mounted Type | 623,000 |
615-0291 | Unmounted Type | 429,000 | |
SD-R150-FM (10ea.) | |||
610-1301 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~90 nm (from front) / 160 nm (from side) ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 856,000 |
610-0301 | Unmounted Type | 726,000 | |
SD-Sphere-FM-M (10ea.) | |||
610-1302 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical sphere diameter: ~2 μm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 2,049,000 |
610-0302 | Unmounted Type | 1,854,000 | |
SD-Sphere-NCH-M (10ea.) | |||
610-1303 | ▪ Cantilever for Non-contact mode ▪ Typical tip length: 10 - 15 μm ▪ Typical sphere diameter: ~2 μm ▪ k = ~42 N/m, f = ~320 kHz |
Mounted Type | 2,049,000 |
610-0303 | Unmounted Type | 1,854,000 | |
Multi75Al-G (10ea.) | |||
610-1321 | ▪ Probe suitable for force modulation mode ▪ Backside reflective coating (Al) ▪ Tip shape: Rotated ▪ Typical tip length: ~17 μm ▪ Typical tip radius: <10 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 381,000 |
610-0321 | Unmounted Type | 267,000 | |
NSC36/Cr-Au (10ea.) | |||
610-1002 | ▪ Probe for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
610-0002 | Unmounted Type | 345,000 | |
NSC14/Cr-Au (10ea.) | |||
610-1013 | ▪ Probe for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 474,000 |
610-0013 | Unmounted Type | 345,000 | |
PPP-NCSTAu (10ea.) | |||
610-1009 | ▪ Probe for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Au ▪ Typical tip length: 10 - 15 μm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 726,000 |
610-0009 | Unmounted Type | 597,000 | |
ElectriMulti75-G (10ea.) | |||
610-1098 | ▪ Probe for electrical modes (EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 474,000 |
610-0098 | Unmounted Type | 345,000 | |
PPP-EFM (10ea.) | |||
610-1101 | ▪ Probe for Conductive AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 824,000 |
610-0101 | Unmounted Type | 694,000 | |
PPP-CONTSCPt (10ea.) | |||
610-1073 | ▪ Probe for DC-EFM/PFM/CP-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 824,000 |
610-0073 | Unmounted Type | 694,000 | |
NSC36/Pt (10ea.) | |||
610-1161 | ▪ Probe for DC-EFM/PFM ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <30 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
610-0161 | Unmounted Type | 345,000 | |
PtSi-FM (10ea.) | |||
610-1039 | ▪ Probe for EFM/KPFM ▪ Platinum silicide coating on both sides of the cantilever ▪ Typical tip length: ~ 12.5 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 2,308,000 |
610-0039 | Unmounted Type | 2,114,000 | |
PPP-NCHAu (10ea.) | |||
610-1074 | ▪ Probe for EFM/KPFM ▪ Backside reflex coating (Cr-Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Tip shape: 4-sided pyramidal ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: <50 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 726,000 |
610-0074 | Unmounted Type | 597,000 | |
PPP-NCHPt (10ea.) | |||
610-1054 | ▪ Probe for EFM/KPFM ▪ Backside reflex coating (Cr/Pt-Ir5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Tip shape: 4-sided pyramidal ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: ~25 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 824,000 |
610-0054 | Unmounted Type | 694,000 | |
Spark 350 Pt (10ea.) | |||
610-1307 | ▪ Probe for EFM/KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm (<30 nm) ▪ k = ~42 N/m, f = ~350 kHz |
Mounted Type | 629,000 |
610-0307 | Unmounted Type | 500,000 | |
Spark 150 Pt (10ea.) | |||
610-1316 | ▪ Probe for EFM/KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm (<30 nm) ▪ k = ~18 N/m, f = ~150 kHz |
Mounted Type | 629,000 |
610-0316 | Unmounted Type | 500,000 | |
Spark 70 Pt (10ea.) | |||
610-1306 | ▪ Probe for EFM/KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm (<30 nm) ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 629,000 |
610-0306 | Unmounted Type | 500,000 | |
CDT-CONTR_T (10ea.), CDT-CONTR (10ea.) | |||
610-1135-01 | ▪ Contact cantilever for conductive AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~0.5 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,483,000 |
610-0135 | Unmounted Type | 2,224,000 | |
PPP-CONTSCPt_T (10ea.), PPP-CONTSCPt (10ea.) | |||
610-1073-01 | ▪ Probe for DC-EFM/PFM/C-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 915,000 |
610-0073 | Unmounted Type | 694,000 | |
25Pt300B_T (1), 25Pt300B (10ea.) | |||
610-1115-01 | ▪ Contact cantilever for conductive AFM (C-AFM)/SCM ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,401,000 |
610-0115 | Unmounted Type | 1,142,000 | |
NSC18/Cr-Au_T (10ea.), NSC18/Cr-Au (10ea.) | |||
610-1023-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 564,000 |
610-0023 | Unmounted Type | 345,000 | |
ElectriMulti75-G (10ea.) | |||
PPP-EFM_T (10ea.), PPP-EFM (10ea.) | |||
610-1101-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 824,000 |
610-0101 | Unmounted Type | 694,000 | |
ElectriMulti75-G (10ea.) | |||
610-1098-01 | ▪ Probe for Conductive AFM ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 564,000 |
610-0098 | Unmounted Type | 345,000 | |
PtSi-CONT_T (10ea.), PtSi-CONT (10ea.) | |||
610-1121-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Platinum silicide coating on both sides of the cantilever ▪ Typical tip length: ~ 12.5 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~13 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,541,000 |
610-0121 | Unmounted Type | 2,282,000 | |
AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.) | |||
605-1264-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 1,544,000 |
605-0264 | Unmounted Type | 1,284,000 | |
AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.) | |||
605-1266-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,184,000 |
605-0266 | Unmounted Type | 1,925,000 | |
605-1265-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 1,544,000 |
605-0265 | Unmounted Type | 1,284,000 | |
605-1267-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,184,000 |
605-0267 | Unmounted Type | 1,925,000 | |
PtSi-NCH_T (10ea.), PtSi-NCH (10ea.) | |||
610-1038-01 | ▪ Contact cantilever for conductive AFM (C-AFM)/SCM ▪ Backside reflex coating (PtSi) ▪ Conductive tip for electrical application, coated with PtSi ▪ Tip shape: 4-sided pyramidal ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: ~25 nm ▪ k = ~42 N/m, f = ~330 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 2,373,000 |
610-0038 | Unmounted Type | 2,114,000 | |
PPP-NCSTPt_T (10ea.), PPP-NCSTPt (10ea.) | |||
610-1043-01 | ▪ Probe suitable for Tapping mode and electrical measurements ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Tip shape: 4-sided ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: 25 nm ▪ k = ~7.4 N/m, f = ~160 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 953,000 |
610-0043 | Unmounted Type | 694,000 | |
CDT-NCHR_T (10ea.), CDT-NCHR (10ea.) | |||
610-1120-01 | ▪ Probe suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,541,000 |
610-0120 | Unmounted Type | 2,282,000 | |
CDT-FMR_T (10ea.), CDT-FMR (10ea.) | |||
610-1238-01 | ▪ Probe suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~6.2 N/m, f = ~105 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,541,000 |
610-0238 | Unmounted Type | 2,282,000 | |
AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.) | |||
605-1264-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 1,544,000 |
605-0264 | Unmounted Type | 1,284,000 | |
AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.) | |||
605-1266-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 2,184,000 |
605-0266 | Unmounted Type | 1,925,000 | |
605-1265-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 1,544,000 |
605-0265 | Unmounted Type | 1,284,000 | |
605-1267-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 2,184,000 |
605-0267 | Unmounted Type | 1,925,000 | |
PPP-EFM_C (10ea.), PPP-EFM (10ea.) | |||
610-1101-02 | ▪ Probe for DC-EFM/PFM/SCM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand |
Mounted Type | 824,000 |
610-0101 | Unmounted Type | 694,000 | |
25Pt300B_C (10ea.), 25Pt300B (10ea.) | |||
610-1115-02 | ▪ Contact cantilever for conductive AFM(CP-AFM)/SCM ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,336,000 |
610-0115 | Unmounted Type | 1,142,000 | |
Pt-Ir (10ea.) | |||
610-0150 | ▪ 0.25 mm diameter Pt-Ir wire ▪ Tip shape: Sharpened tip end for STM |
Cut-wire Type | 234,000 |
PPP-MFMR (10ea.) | |||
610-1061 | ▪ Probe for MFM ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,199,000 |
610-0061 | Unmounted Type | 1,070,000 | |
PPP-LC-MFMR (10ea.) | |||
610-1062 | ▪ Probe for MFM (Low coercivity) ▪ Backside reflex coating (Al) ▪ Soft magnetic coating on the tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,199,000 |
610-0062 | Unmounted Type | 1,070,000 | |
PPP-LM-MFMR (10ea.) | |||
610-1063 | ▪ Probe for MFM (Low magnetic momentum) ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip with reduced magnetic moment (0.5x) compared to PPP-MFMR ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,122,000 |
610-0063 | Unmounted Type | 993,000 | |
SSS-MFMR (10ea.) | |||
610-1064 | ▪ Probe for high resolution MFM ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip with reduced magnetic moment (0.25x) compared to PPP-MFMR ▪ Typical tip radius: <15 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 2,022,000 |
610-0064 | Unmounted Type | 1,828,000 | |
NSC18/Co-Cr/Al BS (10ea.) | |||
610-1026 | ▪ Probe for MFM ▪ Backside reflective coating (Al) ▪ Co-Cr coating on the tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <60 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 507,000 |
610-0026 | Unmounted Type | 377,000 | |
NanoThermal-10 (10ea.) | |||
610-1102 | ▪ Probe with resistive thermometer tip for SThM ▪ Tip made of NiCr and Pd ▪ Typical tip length: ~10 μm ▪ Typical tip radius: <100 nm ▪ k = ~0.4 N/m ▪ Mounted type only ▪ Note: Thermal Analysis (TA) mode is not supported. |
Mounted Type | 5,557,000 |
NanoThermal-5 (5ea.) | |||
605-1102 | ▪ Probe with resistive thermometer tip for SThM ▪ Tip made of NiCr and Pd ▪ Typical tip length: ~10 μm ▪ Typical tip radius: <100 nm ▪ k = ~0.4 N/m ▪ Mounted type only ▪ Note: Thermal Analysis (TA) mode is not supported. |
Mounted Type | 3,057,000 |
Glass NanoPipette (10ea.) | |||
704-0046 | ▪ Pipette for SICM ▪ Borosilicate glass pipette ▪ Pipette opening diameter: ~100 nm ▪ Minimum order quantities are 10ea |
Unmounted Type | 65,000 |
170-0043 | ▪ Pipette for SECCM Single Barrel ▪ Borosilicate glass pipette ▪ Pipette opening diameter: ~500 nm ▪ Minimum order quantities are 10ea |
Unmounted Type | 65,000 |
DT-NCHR (10ea.) | |||
610-1057 | ▪ Probe suitable for lithography ▪ Backside reflex coating (Al) ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz |
Mounted Type | 2,022,000 |
610-0057 | Unmounted Type | 1,828,000 | |
ElectriMulti75-G (10ea.) | |||
610-1098-01 | ▪ Probe for lithography and electrical modes (EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 564,000 |
610-0098 | Unmounted Type | 345,000 | |
25Pt300B (10ea.) | |||
610-1115-01 | ▪ Probe suitable for lithography and C-AFM ▪ Contact cantilever made of platinum ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,401,000 |
610-0115 | Unmounted Type | 1,142,000 | |
CDT-CONTR_T (10ea.), CDT-CONTR (10ea.) | |||
610-1135-01 | ▪ Probe suitable for lithography and C-AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~0.5 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,483,000 |
610-0135 | Unmounted Type | 2,224,000 | |
CDT-NCHR_T (10ea.), CDT-NCHR (10ea.) | |||
610-1120-01 | ▪ Probe suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,541,000 |
610-0120 | Unmounted Type | 2,282,000 | |
PPP-CONTSCPt (10ea.) | |||
610-1073 | ▪ Probe for lithography ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 824,000 |
610-0073 | Unmounted Type | 694,000 | |
NSC36/Pt (10ea.) | |||
610-1161 | ▪ Probe for lithography ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <30 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
610-0161 | Unmounted Type | 345,000 | |
PPP-EFM (10ea.) | |||
610-0101 | ▪ Probe for lithography ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 824,000 |
610-0101 | Unmounted Type | 694,000 | |
NM-RC-SEM (1ea.) | |||
761-0285 | ▪ Cantilever with high force constant for Nanoindentation ▪ Tip shape: cone ▪ Single crystal diamond tip ▪ Typical tip length: ~500 nm ▪ Typical tip radius: ~10 nm ▪ k = ~350 N/m, f = ~750 kHz ▪ Mounted type only ▪ For exact values of tip radius (SEM image), please refer to the enclosed datasheet |
Mounted Type | 701,000 |
BL-AC40TS (10ea.) | |||
610-1049 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Effective tip length: ~3.5 μm (total 7 μm) ▪ Typical tip radius: ~10 nm ▪ k = ~0.09 N/m, f = ~110 kHz |
Mounted Type | 921,000 |
610-0049 | Unmounted Type | 843,000 | |
DNP-S (10ea.) | |||
610-1151 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Typical tip length: 2.5 - 8 μm ▪ Typical tip radius: ~10 nm (<40 nm) ▪ k1 = ~0.35 N/m, f1 = ~65 kHz, k2 = ~0.12 N/m, f2 = ~23 kHz, k3 = ~0.24 N/m, f3 = ~56 kHz, k4 = ~0.06 N/m, f4 = ~18 kHz, ▪ 4 triangular cantilevers on a chip |
Mounted Type | 818,000 |
610-0151 | Unmounted Type | 662,000 | |
NSC36/Cr-Au (10ea.) | |||
610-1002 | ▪ Probe for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
610-0002 | Unmounted Type | 345,000 | |
PNP-DB (10ea.) | |||
610-1145 | ▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ Tip shape: Pyramidal ▪ Typical tip length: 3.5 μm ▪ k1 = ~0.48 N/m, f1 = ~67 kHz, k2 = ~0.06 N/m, f2 = ~17 kHz ▪ 2 cantilevers on a chip |
Mounted Type | 448,000 |
610-0145 | Unmounted Type | 318,000 | |
PNP-TR (10ea.) | |||
610-1146 | ▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ Tip shape: Pyramidal ▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz ▪ 2 triangular cantilevers on a chip |
Mounted Type | 448,000 |
610-0146 | Unmounted Type | 318,000 | |
QP-Bio AC (10ea.) | |||
610-1283 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Typical tip length: 7 μm ▪ Typical tip radius: < 10 nm ▪ k1 = ~0.3 N/m, f1 = ~90 kHz, k2 = ~0.1 N/m, f2 = ~50 kHz, k3 = ~0.06 N/m, f3 = ~30 kHz ▪ 3 triangular cantilevers on a chip |
Mounted Type | 694,000 |
610-0283 | Unmounted Type | 564,000 | |
OMCL-AC55TS (10ea.) | |||
610-1199 | ▪ Non-contact cantilever with high resonant frequency ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Typical tip length: ~12 μm ▪ Typical tip radius: ~7 nm ▪ k = ~85 N/m, f = ~1600 kHz |
Mounted Type | 1,050,000 |
610-0199 | Unmounted Type | 972,000 | |
BL-AC40TS (10ea.) | |||
610-1049 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Effective tip length: ~3.5 μm (total 7 μm) ▪ Typical tip radius: ~10 nm ▪ k = ~0.09 N/m, f = ~110 kHz |
Mounted Type | 921,000 |
610-0049 | Unmounted Type | 843,000 | |
NSC36/Cr-Au (10ea.) | |||
610-1002 | ▪ Probe for Tapping Mode in liquid ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
610-0002 | Unmounted Type | 345,000 | |
MSNL (10ea.) | |||
610-1232 | ▪Cantilever for Tapping Mode in liquid ▪ Backside reflex coating (Au) ▪ Typical tip length: 2.5 - 8.0 μm ▪ Typical tip radius: 2 nm ▪ k1 = ~0.07 N/m, f1 = ~22 kHz, k2 = ~0.02 N/m, f2 = ~15 kHz, k3 = ~0.01 N/m, f3 = ~7 kHz ▪ k4 = ~0.03 N/m, f4 = ~15 kHz, k5 = ~0.1 N/m, f5 = ~38 kHz, k6 = ~0.6 N/m, f6 = ~125 kHz ▪ 6 cantilevers on a chip |
Mounted Type | 791,000 |
610-0232 | Unmounted Type | 662,000 | |
TAP300DLC (10ea.) | |||
610-1251 | ▪Cantilever for Tapping Mode in liquid ▪ Tip shape: Rotated shape on ~15 μm setback position ▪ Hard diamond-like-carbon coated tip ▪ Typical tip length: 17 μm ▪ Typical tip radius: <15 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 474,000 |
610-0251 | Unmounted Type | 345,000 | |
PPP-CONT (10ea.) | |||
610-1111 | ▪Cantilever for Tapping Mode in liquid ▪ Typical tip length: 10-15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 591,000 |
610-0111 | Unmounted Type | 461,000 | |
PPP-CONTSC_T (10ea.), PPP-CONTSC (10ea.) | |||
610-1208-03 | ▪ Contact cantilever ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~25 kHz ▪ Mounted type on Teflon-coated (both sides) chip carrier |
Mounted Type | 591,000 |
610-0208 | Unmounted Type | 461,000 | |
TL-CONT (10ea.) | |||
610-1069 | ▪ Tipless cantilever for special applications ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 591,000 |
610-0069 | Unmounted Type | 461,000 | |
HQ:NSC35/tipless/Al BS (15ea.) | |||
615-1299 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k1 = ~8.9 N/m, f1 = ~205 kHz, k2 = ~16 N/m, f2 = ~300 kHz, k3 = ~5.4 N/m, f3 = ~150 kHz |
Mounted Type | 1,342,000 |
615-0299 | Unmounted Type | 1,212,000 | |
HQ:CSC37/tipless/Al BS (15ea.) | |||
615-1300 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k1 = ~0.8 N/m, f1 = ~40 kHz, k2 = ~0.3 N/m, f2 = ~20 kHz, k3 = ~0.4 N/m, f3 = ~30 kHz |
Mounted Type | 1,342,000 |
615-0300 | Unmounted Type | 1,212,000 | |
ACLA-TL (10ea.) | |||
610-1317 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k = ~58 N/m, f = ~190 kHz |
Mounted Type | 482,000 |
610-0317 | Unmounted Type | 369,000 | |
ACTA-TL (10ea.) | |||
610-1318 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k = ~37 N/m, f = ~300 kHz |
Mounted Type | 482,000 |
610-0318 | Unmounted Type | 369,000 | |
ACSTA-TL (10ea.) | |||
610-1319 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k = ~7.8 N/m, f = ~150 kHz |
Mounted Type | 482,000 |
610-0319 | Unmounted Type | 369,000 | |
ESD-safe Package for EBD Tips | |||
370-0413 | ▪ Contains up to 12 ea. of cantilevers ▪ Cantilevers are not included ▪ Mounting service and returning shipping costs to Park Systems are not included ▪ NOTE: Contact Park Systems for other specific cantilever models or combination. | 1,176,000 |
Contact Mode/LFM
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도* |
|
---|---|---|---|
PPP-CONTSCR (10ea.) | |||
610-1093 | ▪ Contact cantilever ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 532,000 |
610-0093 | Unmounted Type | 454,000 | |
NSC36/Al BS (10ea.) | |||
610-1001 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 416,000 |
610-0001 | Unmounted Type | 286,000 | |
NSC36/Hard/Al BS (10ea.) | |||
610-1004 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <20 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 507,000 |
610-0004 | Unmounted Type | 377,000 | |
PNP-DB (10ea.) | |||
610-1145 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Tip shape: Sharpened tetrahedral on zero setback position ▪ Typical tip length: ~14 μm ▪ Typical tip radius: ~7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 448,000 |
610-0145 | Unmounted Type | 318,000 | |
PNP-TR (10ea.) | |||
610-1146 | ▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ Tip shape: Pyramidal ▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz ▪ 2 triangular cantilevers on a chip |
Mounted Type | 448,000 |
610-0146 | Unmounted Type | 318,000 | |
PPP-LFMR (10ea.) | |||
610-1076 | ▪ Contact cantilever with high sensitivity for lateral/frictional force measurement ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~23 kHz |
Mounted Type | 591,000 |
610-0076 | Unmounted Type | 461,000 |
True Non Contact Mode
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 |
|
---|---|---|---|
PPP-NCHR (10ea.) | |||
610-1051 | ▪ Non-contact cantilever with high resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 494,000 |
610-0051 | Unmounted Type | 416,000 | |
SSS-NCHR (10ea.) | |||
610-1056 | ▪ Non-contact cantilever with super sharp tip ▪ Backside reflex coating (Al) ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,161,000 |
610-0056 | Unmounted Type | 1,083,000 | |
BL-AC40TS (10ea.) | |||
610-1049 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Effective tip length: ~3.5 μm (total 7 μm) ▪ Typical tip radius: ~10 nm ▪ k = ~0.09 N/m, f = ~110 kHz |
Mounted Type | 921,000 |
610-0049 | Unmounted Type | 843,000 | |
OMCL-AC160TS (10ea.) | |||
610-1183 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Tip shape: Sharpened tetrahedral on zero setback position ▪ Typical tip length: ~14 μm ▪ Typical tip radius: ~7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 507,000 |
610-0183 | Unmounted Type | 429,000 | |
ATEC-NC (10ea.) | |||
610-1020 | ▪ Non-contact cantilever ▪ Tip shape: Tetrahedral tip on zero setback position ▪ Typical tip length: 15 - 20 μm ▪ Typical tip radius: <10 nm ▪ k = ~45 N/m, f = ~335 kHz |
Mounted Type | 713,000 |
610-0020 | Unmounted Type | 636,000 | |
ACTA (10ea.) | |||
610-1201 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Typical tip length: 14 - 16 μm ▪ Typical tip radius: ~6 nm ▪ k = ~37 N/m, f = ~300 kHz |
Mounted Type | 500,000 |
610-0201 | Unmounted Type | 422,000 | |
PPP-NCH (10ea.) | |||
610-1125 | ▪ Non-contact cantilever with high resonant frequency ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 591,000 |
610-0125 | Unmounted Type | 461,000 | |
SSS-NCH (10ea.) | |||
610-1081 | ▪ Non-contact cantilever with super sharp tip ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,277,000 |
610-0081 | Unmounted Type | 1,083,000 | |
PPP-NCLR (10ea.) | |||
610-1105 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 591,000 |
610-0106 | Unmounted Type | 461,000 | |
SSS-NCLR (10ea.) | |||
610-1106 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,277,000 |
610-0107 | Unmounted Type | 1,083,000 | |
PPP-NCL (10ea.) | |||
610-1095 | ▪ Non-contact cantilever with low resonant frequency ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 591,000 |
610-0095 | Unmounted Type | 461,000 | |
SSS-NCL (10ea.) | |||
610-1094 | ▪ Non-contact cantilever with low resonant frequency ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,212,000 |
610-0094 | Unmounted Type | 1,083,000 | |
NSC15/Al BS (10ea.) | |||
610-1011 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k = ~40 N/m, f = ~325 kHz |
Mounted Type | 389,000 |
610-0011 | Unmounted Type | 312,000 | |
AR5-NCHR (10ea.) | |||
610-1055 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,466,000 |
610-0055 | Unmounted Type | 1,271,000 | |
AR5-NCH (10ea.) | |||
610-1127 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,466,000 |
610-0127 | Unmounted Type | 1,271,000 | |
AR5-NCLR (10ea.) | |||
610-1089 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,466,000 |
610-0089 | Unmounted Type | 1,271,000 | |
AR5-NCL (10ea.) | |||
610-1090 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,466,000 |
610-0090 | Unmounted Type | 1,271,000 | |
AR5T-NCHR (10ea.) | |||
610-1060 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 2,100,000 |
610-0060 | Unmounted Type | 1,906,000 | |
AR5T-NCH (10ea.) | |||
610-1126 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 2,100,000 |
610-0126 | Unmounted Type | 1,906,000 | |
HARTA-12-2 (5ea.) | |||
605-1123 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,114,000 |
605-0123 | Unmounted Type | 2,074,000 | |
HARTA-12-4 (5ea.) | |||
605-1124 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~4 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,114,000 |
605-0124 | Unmounted Type | 2,074,000 | |
HARTA-12-6 (5ea.) | |||
605-1138 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~6 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,535,000 |
605-0138 | Unmounted Type | 2,495,000 | |
EBD2-100A (5ea.) | |||
605-1132 | ▪ Non-contact cantilever with high aspect ratio tip (>6:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~2 μm ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
605-0132 | Unmounted Type | 1,971,000 | |
EBD4-200A (5ea.) | |||
605-1139 | ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~4 μm (max.) ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
605-0139 | Unmounted Type | 1,971,000 | |
EBD6-400A (5ea.) | |||
605-1134 | ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~6 μm (max.) ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
605-0134 | Unmounted Type | 1,971,000 | |
MCNT-100 (5ea.) | |||
605-1156 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~100 nm ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 7,290,000 |
605-0156 | Unmounted Type | 7,128,000 | |
MCNT-150 (5ea.) | |||
605-1157 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~150 nm ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 7,290,000 |
605-0157 | Unmounted Type | 7,128,000 | |
MCNT-300 (5ea.) | |||
605-1158 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~300 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
605-0158 | Unmounted Type | 6,480,000 | |
MCNT-400 (5ea.) | |||
605-1159 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~400 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
605-0159 | Unmounted Type | 6,480,000 | |
MCNT-500 (5ea.) | |||
605-1160 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~500 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
605-0160 | Unmounted Type | 6,480,000 | |
Hi'Res-C14/Cr-Au (10ea.) | |||
610-1155 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflective coating (Au) ▪ Typical spike length: 100 - 200 nm ▪ Typical tip radius: ~1 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 1,336,000 |
610-0155 | Unmounted Type | 1,142,000 | |
OMCL-AC240TS (10ea.) | |||
610-1184 | ▪ Non-Contact cantilever with low resonant frequency ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: 7 nm ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 507,000 |
610-0184 | Unmounted Type | 429,000 |
FMM / F-d / PinPoint
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 |
|
---|---|---|---|
PPP-FMR (10ea.) | |||
610-1110 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~2 N/m, f = ~75 kHz |
Mounted Type | 591,000 |
610-0110 | Unmounted Type | 461,000 | |
DT-FMR (10ea.) | |||
610-1077 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~6.2 N/m, f = ~105 kHz |
Mounted Type | 1,887,000 |
610-0077 | Unmounted Type | 1,692,000 | |
PPP-NCSTR (10ea.) | |||
610-1117 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 591,000 |
610-0117 |
Unmounted Type | 461,000 | |
NSC36/Al BS (10ea.) | |||
610-1001 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 416,000 |
610-0001 |
Unmounted Type | 286,000 | |
NSC14/Hard/Al BS (10ea.) | |||
610-1140 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <20 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 507,000 |
610-0140 |
Unmounted Type | 377,000 | |
SD-R30-CONT (10ea.) | |||
610-1230 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 856,000 |
610-0230 | Unmounted Type | 778,000 | |
SD-R30-FM (10ea.) | |||
610-1229 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 856,000 |
610-0229 | Unmounted Type | 778,000 | |
SD-R30-NCH (10ea.) | |||
610-1228 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 856,000 |
610-0228 | Unmounted Type | 778,000 | |
MSS-Soft (5ea.) | |||
610-1254 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~250 nm ▪ Typical tip radius: <2 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,847,000 |
610-0254 | Unmounted Type | 1,782,000 | |
SSS-FMR (10ea.) | |||
610-1245 | ▪ Cantilever with force constant suitable for FMM with super sharp tip ▪ Backside reflex coating (Al) ▪ Typical tip radius: 2 nm (< 5 nm) ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,277,000 |
610-0245 | Unmounted Type | 1,083,000 | |
NSC19/Cr-Au (10ea.) | |||
610-1234 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~0.5 N/m, f = ~65 kHz |
Mounted Type | 474,000 |
610-0234 | Unmounted Type | 345,000 |