|고객문의  Global
Park Probe Store

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다. 에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
  PPP-NCHR (10ea.)    
610-1051 ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 551,000
610-0051 Unmounted Type 437,000
  SSS-NCHR (10ea.)    
610-1056 ▪ Non-contact cantilever with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,248,000
610-0056 Unmounted Type 1,070,000
  BL-AC40TS (10ea.)    
610-1049 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~10 nm
▪ k = ~0.09 N/m, f = ~110 kHz
Mounted Type 921,000
610-0049 Unmounted Type 843,000
  OMCL-AC160TS (10ea.)    
610-1183 ▪ Non-Contact cantilever with high resonant frequency 
▪ Backside reflective coating (Al)
▪ Tip shape: Sharpened tetrahedral on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: ~7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 507,000
610-0183 Unmounted Type 429,000
  ATEC-NC (10ea.)    
610-1020 ▪ Non-contact cantilever
▪ Tip shape: Tetrahedral tip on zero setback position
▪ Typical tip length: 15 - 20 μm
▪ Typical tip radius: <10 nm
▪ k = ~45 N/m, f = ~335 kHz
Mounted Type 713,000
610-0020 Unmounted Type 636,000
  ACTA (10ea.)    
610-1201 ▪ Non-contact cantilever
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Typical tip length: 14 - 16 μm
▪ Typical tip radius: ~6 nm
▪ k = ~37 N/m, f = ~300 kHz
Mounted Type 500,000
610-0201 Unmounted Type 422,000
  PPP-NCH (10ea.)    
610-1125 ▪ Non-contact cantilever with high resonant frequency
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 591,000
610-0125 Unmounted Type 461,000
  SSS-NCH (10ea.)    
610-1081 ▪ Non-contact cantilever with super sharp tip
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,361,000
610-0081 Unmounted Type 1,167,000
  PPP-NCLR (10ea.)    
610-1105 ▪ Non-contact cantilever with low resonant frequency 
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 629,000
610-0105 Unmounted Type 500,000
  SSS-NCLR (10ea.)    
610-1106 ▪ Non-contact cantilever with low resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,361,000
610-0106 Unmounted Type 1,083,000
  PPP-NCL (10ea.)    
610-1095 ▪ Non-contact cantilever with low resonant frequency 
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 629,000
610-0095 Unmounted Type 500,000
  SSS-NCL (10ea.)    
610-1094 ▪ Non-contact cantilever with low resonant frequency 
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,248,000
610-0094 Unmounted Type 1,070,000
  NSC15/Al BS (10ea.)    
610-1011 ▪ Non-contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k = ~40 N/m, f = ~325 kHz
Mounted Type 389,000
610-0011 Unmounted Type 312,000
  AR5-NCHR (10ea.)    
610-1055 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,569,000
610-0055 Unmounted Type 1,374,000
  AR5-NCH (10ea.)    
610-1127 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,418,000
610-0127 Unmounted Type 1,248,000
  AR5-NCLR (10ea.)    
610-1089 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating 
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,418,000
610-0089 Unmounted Type 1,248,000
  AR5-NCL (10ea.)    
610-1090 - Discontinued by manufacturer. AR5-NCLR (610-0089/610-1089) is recommended. Mounted Type
610-0090 Unmounted Type
  AR5T-NCHR (10ea.)    
610-1060 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 2,256,000
610-0060 Unmounted Type 2,062,000
  AR5T-NCH (10ea.)    
610-1126 - Discontinued by manufacturer. AR5T-NCHR (610-0060/610-1060) is recommended Mounted Type
610-0126 Unmounted Type
  HARTA-12-2 (5ea.)    
605-1123 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,171,000
605-0123 Unmounted Type 2,074,000
  HARTA-12-4 (5ea.)    
605-1124 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~4 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,171,000
605-0124 Unmounted Type 2,074,000
  HARTA-12-6 (5ea.)    
605-1138 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~6 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,171,000
605-0138 Unmounted Type 2,074,000
  EBD2-100A (5ea.)    
605-1132 ▪ Non-contact cantilever with high aspect ratio tip (>6:1) (HDC/DLC)
▪ Backside reflex coating 
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~2 μm
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0132 Unmounted Type 1,971,000
  EBD4-200A (5ea.)    
605-1139 ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating 
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~4 μm (max.)
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0139 Unmounted Type 1,971,000
  EBD6-400A (5ea.)    
605-1134 ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~6 μm (max.)
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0134 Unmounted Type 1,971,000
  MCNT-100 (5ea.)    
605-1156 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~100 nm
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 7,290,000
605-0156 Unmounted Type 7,128,000
  MCNT-150 (5ea.)    
605-1157 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~150 nm 
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 7,290,000
605-0157 Unmounted Type 7,128,000
  MCNT-300 (5ea.)    
605-1158 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~300 nm 
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0158 Unmounted Type 6,480,000
  MCNT-400 (5ea.)    
605-1159 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~400 nm
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0159 Unmounted Type 6,480,000
  MCNT-500 (5ea.)    
605-1160 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~500 nm
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0160 Unmounted Type 6,480,000
  Hi'Res-C14/Cr-Au (5ea.)    
605-1155 ▪ Non-contact cantilever with low resonant frequency 
▪ Backside reflective coating (Au)
▪ Typical spike length: 100 - 200 nm
▪ Typical tip radius: ~1 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 772,000
605-0155 Unmounted Type 707,000
  OMCL-AC240TS (10ea.)    
610-1184 ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: 7 nm
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 507,000
610-0184 Unmounted Type 429,000
  PPP-XYNCSTR (10ea.)    
610-1280 ▪ Non-contact/Tapping Mode cantilever
▪ Backside reflex coating (Al)
▪ Tip shape: 4-sided
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~7 nm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 591,000
610-0280 Unmounted Type 461,000
  ATEC-NCAu (10ea.)    
610-1209 ▪ Non-contact cantilever
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral tip on zero setback position
▪ Tip coated with Cr-Au
▪ Typical tip length: 15 - 20 μm
▪ Typical tip radius: ~63 nm
▪ k = ~45 N/m, f = ~335 kHz
Mounted Type 1,466,000
610-0209 Unmounted Type 1,271,000
  EBD-24 (5ea.)    
605-1295 ▪ Non-contact cantilever
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~24 μm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,442,000
605-0295 Unmounted Type 6,312,000
  240AC-NA (24 ea.)    
624-1297 ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: <7 nm
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 1,044,000
624-0297 Unmounted Type 734,000
  Scout 70 (10ea.)    
610-1305 ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~5 nm (<10 nm)
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 545,000
610-0305 Unmounted Type 416,000
  Scout 150 (10ea.)    
610-1315 ▪ Non-contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~5 nm (<10 nm)
▪ k = ~18 N/m, f = ~150 kHz
Mounted Type 545,000
610-0315 Unmounted Type 416,000
  ISC-125C40-R (5ea.)    
605-1312 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflex coating (Al)
▪ Typical spike length: ~7 μm
▪ Typical tip radius: <10 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 477,000
605-0312 Unmounted Type 364,000
  EBD-16 (5ea.)    
605-1276 ▪ Non-contact cantilever with high aspect ratio tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~16 um
▪ k = ~40 N/m, f = ~320 kHz
NOTE: Requires ESD-safe Package for EBD Tips (370-0413) for shipment.
Mounted Type 3,222,000
605-0276 Unmounted Type 3,108,000
  160AC-NG (10ea.)    
610-1322 ▪ Probe suitable for tapping mode
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Typical tip length: ~14 μm
▪ Typical tip radius: <7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 477,000
610-0322 Unmounted Type 364,000
  PPP-CONTSCR (10ea.)    
610-1093 ▪ Contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 551,000
610-0093 Unmounted Type 437,000
  NSC36/Al BS (10ea.)    
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 416,000
610-0001 Unmounted Type 286,000
  NSC36/Hard/Al BS (10ea.)    
610-1004 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 507,000
610-0004 Unmounted Type 377,000
  PNP-DB (10ea.)    
610-1145 ▪ Non-Contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Tip shape: Sharpened tetrahedral on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: ~7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 448,000
610-0145 Unmounted Type 318,000
  PNP-TR (10ea.)    
610-1146 ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz
▪ 2 triangular cantilevers on a chip
Mounted Type 448,000
610-0146 Unmounted Type 318,000
  PPP-LFMR (10ea.)    
610-1076 ▪ Contact cantilever with high sensitivity for lateral/frictional force measurement
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~23 kHz
Mounted Type 629,000
610-0076 Unmounted Type 500,000
  OMCL-AC200TS (10ea.)    
610-1187 ▪ Probe suitable for tapping
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: 7 nm
▪ k = ~9 N/m, f = ~150 kHz
Mounted Type 648,000
610-0187 Unmounted Type 519,000
  SHOCONA (10ea.)    
610-1108 ▪ Contact cantilever
▪ Backside reflex coating (Al)
▪ Tip shape: Pyramidal
▪ Typical tip length: 14 - 16 μm
▪ Typical tip radius: <6 nm
▪ k = ~0.14 N/m, f = ~21 kHz
Mounted Type 551,000
610-0108 Unmounted Type 422,000
  200AC-NA (24 ea.)    
624-1296 ▪ Probe suitable for tapping
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: <7 nm
▪ k = ~9 N/m, f = ~135 kHz
Mounted Type 1,044,000
624-0296 Unmounted Type 734,000
  3XC-NA (24 ea.)    
624-1298 ▪ Probe suitable for contact or tapping mode
▪ Backside reflex coating (Al)
▪ Typical tip length: ~14 μm
▪ Typical tip radius: <7 nm
▪ k1 = ~0.3 N/m, f1 = ~17 kHz, k2 = ~9 N/m, f2 = ~150 kHz, k3 = ~2.5 N/m, f3 = ~75 kHz
Mounted Type 1,044,000
624-0298 Unmounted Type 734,000
  HQ:CSC17/Pt (15ea.)    
615-1320 ▪ Probe suitable for contact mode
▪ Backside reflex coating (Cr/Pt-Ir5)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 624,000
615-0320 Unmounted Type 454,000
  HQ:CSC17/Cr-Au (15ea.)    
615-1233 ▪ Probe suitable for contact, LFM and C-AFM
▪ Backside reflex coating (Cr-Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 15 μm
▪ Typical tip radius: <35 nm
▪ k = ~0.18 N/m, f = ~13 kHz
Mounted Type 624,000
615-0233 Unmounted Type 454,000
  PPP-FMR (10ea.)    
610-1110 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~2 N/m, f = ~75 kHz
Mounted Type 629,000
610-0110 Unmounted Type 500,000
  DT-FMR (10ea.)    
610-1077 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~6.2 N/m, f = ~105 kHz
Mounted Type 2,022,000
610-0077 Unmounted Type 1,828,000
  PPP-NCSTR (10ea.)    
610-1117 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 629,000
610-0117 Unmounted Type 500,000
  NSC36/Al BS (10ea.)    
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 416,000
610-0001 Unmounted Type 286,000
  NSC14/Hard/Al BS (10ea.)    
610-1140 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 507,000
610-0140 Unmounted Type 377,000
  SD-R30-CONT (10ea.)    
610-1230 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 856,000
610-0230 Unmounted Type 778,000
  SD-R30-FM (10ea.)    
610-1229 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 856,000
610-0229 Unmounted Type 778,000
  SD-R30-NCH (10ea.)    
610-1228 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 856,000
610-0228 Unmounted Type 778,000
  MSS-Soft (5ea.)    
605-1254 ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~250 nm
▪ Typical tip radius: <2 nm
▪ k = ~2.8 N/m, f = ~75 kHz

▪NOTE: Requires ESD-safe Package (370-0413) for EBD Tips for shipment.
Mounted Type 1,847,000
605-0254 Unmounted Type 1,782,000
  SSS-FMR (10ea.)    
610-1245 ▪ Cantilever with force constant suitable for FMM with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: 2 nm (< 5 nm)
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,361,000
610-0245 Unmounted Type 1,167,000
  NSC19/Al BS (15ea.)    
615-1291 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k = ~0.5 N/m, f = ~65 kHz
Mounted Type 623,000
615-0291 Unmounted Type 429,000
  SD-R150-FM (10ea.)    
610-1301 ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~90 nm (from front) / 160 nm (from side)
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 856,000
610-0301 Unmounted Type 726,000
  SD-Sphere-FM-M (10ea.)    
610-1302 ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical sphere diameter: ~2 μm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 2,049,000
610-0302 Unmounted Type 1,854,000
  SD-Sphere-NCH-M (10ea.)    
610-1303 ▪ Cantilever for Non-contact mode
▪ Typical tip length: 10 - 15 μm
▪ Typical sphere diameter: ~2 μm
▪ k = ~42 N/m, f = ~320 kHz
Mounted Type 2,049,000
610-0303 Unmounted Type 1,854,000
  Multi75Al-G (10ea.)    
610-1321 ▪ Probe suitable for force modulation mode
▪ Backside reflective coating (Al)
▪ Tip shape: Rotated
▪ Typical tip length: ~17 μm
▪ Typical tip radius: <10 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 381,000
610-0321 Unmounted Type 267,000
  NSC36/Cr-Au (10ea.)    
610-1002 ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0002 Unmounted Type 345,000
  NSC14/Cr-Au (10ea.)    
610-1013 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 474,000
610-0013 Unmounted Type 345,000
  PPP-NCSTAu (10ea.)    
610-1009 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Au
▪ Typical tip length: 10 - 15 μm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 726,000
610-0009 Unmounted Type 597,000
  ElectriMulti75-G (10ea.)    
610-1098 ▪ Probe for electrical modes (EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 474,000
610-0098 Unmounted Type 345,000
  PPP-EFM (10ea.)    
610-1101 ▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  PPP-CONTSCPt (10ea.)    
610-1073 ▪ Probe for DC-EFM/PFM/CP-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 824,000
610-0073 Unmounted Type 694,000
  NSC36/Pt (10ea.)    
610-1161 ▪ Probe for DC-EFM/PFM
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0161 Unmounted Type 345,000
  PtSi-FM (10ea.)    
610-1039 ▪ Probe for EFM/KPFM
▪ Platinum silicide coating on both sides of the cantilever
▪ Typical tip length: ~ 12.5 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 2,308,000
610-0039 Unmounted Type 2,114,000
  PPP-NCHAu (10ea.)    
610-1074 ▪ Probe for EFM/KPFM
▪ Backside reflex coating (Cr-Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: <50 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 726,000
610-0074 Unmounted Type 597,000
  PPP-NCHPt (10ea.)    
610-1054 ▪ Probe for EFM/KPFM
▪ Backside reflex coating (Cr/Pt-Ir5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: ~25 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 824,000
610-0054 Unmounted Type 694,000
  Spark 350 Pt (10ea.)    
610-1307 ▪ Probe for EFM/KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm (<30 nm)
▪ k = ~42 N/m, f = ~350 kHz
Mounted Type 629,000
610-0307 Unmounted Type 500,000
  Spark 150 Pt (10ea.)    
610-1316 ▪ Probe for EFM/KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm (<30 nm)
▪ k = ~18 N/m, f = ~150 kHz
Mounted Type 629,000
610-0316 Unmounted Type 500,000
  Spark 70 Pt (10ea.)    
610-1306 ▪ Probe for EFM/KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm (<30 nm)
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 629,000
610-0306 Unmounted Type 500,000
  CDT-CONTR_T (10ea.), CDT-CONTR (10ea.)    
610-1135-01 ▪ Contact cantilever for conductive AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~0.5 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,483,000
610-0135 Unmounted Type 2,224,000
  PPP-CONTSCPt_T (10ea.), PPP-CONTSCPt (10ea.)    
610-1073-01 ▪ Probe for DC-EFM/PFM/C-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with
Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 915,000
610-0073 Unmounted Type 694,000
  25Pt300B_T (1), 25Pt300B (10ea.)    
610-1115-01 ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
▪ Recommended for high voltage/current application
above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115 Unmounted Type 1,142,000
  NSC18/Cr-Au_T (10ea.), NSC18/Cr-Au (10ea.)    
610-1023-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 564,000
610-0023 Unmounted Type 345,000
  ElectriMulti75-G (10ea.)    
  PPP-EFM_T (10ea.), PPP-EFM (10ea.)    
610-1101-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  ElectriMulti75-G (10ea.)    
610-1098-01 ▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 564,000
610-0098 Unmounted Type 345,000
  PtSi-CONT_T (10ea.), PtSi-CONT (10ea.)    
610-1121-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Platinum silicide coating on both sides of the cantilever
▪ Typical tip length: ~ 12.5 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~13 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,541,000
610-0121 Unmounted Type 2,282,000
  AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.)    
605-1264-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 1,544,000
605-0264 Unmounted Type 1,284,000
  AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.)    
605-1266-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,184,000
605-0266 Unmounted Type 1,925,000
  AD-40-AS_T (5ea.), AD-40-AS (5ea.)    
605-1265-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 1,544,000
605-0265 Unmounted Type 1,284,000
  AD-40-SS_T (5ea.), AD-40-SS (5ea.)    
605-1267-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,184,000
605-0267 Unmounted Type 1,925,000
  PtSi-NCH_T (10ea.), PtSi-NCH (10ea.)    
610-1038-01 ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Backside reflex coating (PtSi)
▪ Conductive tip for electrical application, coated with PtSi
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: ~25 nm
▪ k = ~42 N/m, f = ~330 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 2,373,000
610-0038 Unmounted Type 2,114,000
  PPP-NCSTPt_T (10ea.), PPP-NCSTPt (10ea.)    
610-1043-01 ▪ Probe suitable for Tapping mode and electrical measurements
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Tip shape: 4-sided
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: 25 nm
▪ k = ~7.4 N/m, f = ~160 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 953,000
610-0043 Unmounted Type 694,000
  CDT-NCHR_T (10ea.), CDT-NCHR (10ea.)    
610-1120-01 ▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,541,000
610-0120 Unmounted Type 2,282,000
  CDT-FMR_T (10ea.), CDT-FMR (10ea.)    
610-1238-01 ▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~6.2 N/m, f = ~105 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,541,000
610-0238 Unmounted Type 2,282,000
  AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.)    
605-1264-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 1,544,000
605-0264 Unmounted Type 1,284,000
  AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.)    
605-1266-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 2,184,000
605-0266 Unmounted Type 1,925,000
  AD-40-AS_T (5ea.), AD-40-AS (5ea.)    
605-1265-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 1,544,000
605-0265 Unmounted Type 1,284,000
  AD-40-SS_T (5ea.), AD-40-SS (5ea.)    
605-1267-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 2,184,000
605-0267 Unmounted Type 1,925,000
  PPP-EFM_C (10ea.), PPP-EFM (10ea.)    
610-1101-02 ▪ Probe for DC-EFM/PFM/SCM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  25Pt300B_C (10ea.), 25Pt300B (10ea.)    
610-1115-02 ▪ Contact cantilever for conductive AFM(CP-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
▪ Recommended for high voltage/current application above ±10 V or 1 µA
Mounted Type 1,336,000
610-0115 Unmounted Type 1,142,000
  Pt-Ir (10ea.)    
610-0150 ▪ 0.25 mm diameter Pt-Ir wire
▪ Tip shape: Sharpened tip end for STM
Cut-wire Type 234,000
  PPP-MFMR (10ea.)    
610-1061 ▪ Probe for MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,199,000
610-0061 Unmounted Type 1,070,000
  PPP-LC-MFMR (10ea.)    
610-1062 ▪ Probe for MFM (Low coercivity)
▪ Backside reflex coating (Al)
▪ Soft magnetic coating on the tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,199,000
610-0062 Unmounted Type 1,070,000
  PPP-LM-MFMR (10ea.)    
610-1063 ▪ Probe for MFM (Low magnetic momentum)
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment (0.5x) compared to PPP-MFMR
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,122,000
610-0063 Unmounted Type 993,000
  SSS-MFMR (10ea.)    
610-1064 ▪ Probe for high resolution MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment (0.25x) compared to PPP-MFMR
▪ Typical tip radius: <15 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 2,022,000
610-0064 Unmounted Type 1,828,000
  NSC18/Co-Cr/Al BS (10ea.)    
610-1026 ▪ Probe for MFM
▪ Backside reflective coating (Al)
▪ Co-Cr coating on the tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <60 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 507,000
610-0026 Unmounted Type 377,000
  NanoThermal-10 (10ea.)    
610-1102 ▪ Probe with resistive thermometer tip for SThM
▪ Tip made of NiCr and Pd
▪ Typical tip length: ~10 μm
▪ Typical tip radius: <100 nm
▪ k = ~0.4 N/m
▪ Mounted type only

▪ Note: Thermal Analysis (TA) mode is not supported.
Mounted Type 5,557,000
  NanoThermal-5 (5ea.)    
605-1102 ▪ Probe with resistive thermometer tip for SThM
▪ Tip made of NiCr and Pd
▪ Typical tip length: ~10 μm
▪ Typical tip radius: <100 nm
▪ k = ~0.4 N/m
▪ Mounted type only

▪ Note: Thermal Analysis (TA) mode is not supported.
Mounted Type 3,057,000
  Glass NanoPipette (10ea.)    
704-0046 ▪ Pipette for SICM
▪ Borosilicate glass pipette
▪ Pipette opening diameter: ~100 nm
▪ Minimum order quantities are 10ea
Unmounted Type 65,000
170-0043 ▪ Pipette for SECCM Single Barrel
▪ Borosilicate glass pipette
▪ Pipette opening diameter: ~500 nm
▪ Minimum order quantities are 10ea
Unmounted Type 65,000
  DT-NCHR (10ea.)    
610-1057 ▪ Probe suitable for lithography
▪ Backside reflex coating (Al)
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
Mounted Type 2,022,000
610-0057 Unmounted Type 1,828,000
  ElectriMulti75-G (10ea.)    
610-1098-01 ▪ Probe for lithography and electrical modes (EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 564,000
610-0098 Unmounted Type 345,000
  25Pt300B (10ea.)    
610-1115-01 ▪ Probe suitable for lithography and C-AFM
▪ Contact cantilever made of platinum
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Recommended for high voltage/current application above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115 Unmounted Type 1,142,000
  CDT-CONTR_T (10ea.), CDT-CONTR (10ea.)    
610-1135-01 ▪ Probe suitable for lithography and C-AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~0.5 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,541,000
610-0135 Unmounted Type 2,282,000
  CDT-NCHR_T (10ea.), CDT-NCHR (10ea.)    
610-1120-01 ▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,541,000
610-0120 Unmounted Type 2,282,000
  PPP-CONTSCPt (10ea.)    
610-1073 ▪ Probe for lithography
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 824,000
610-0073 Unmounted Type 694,000
  NSC36/Pt (10ea.)    
610-1161 ▪ Probe for lithography
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0161 Unmounted Type 345,000
  PPP-EFM (10ea.)    
610-0101 ▪ Probe for lithography
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  NM-RC-SEM (1ea.)    
761-0285 ▪ Cantilever with high force constant for Nanoindentation
▪ Tip shape: cone
▪ Single crystal diamond tip
▪ Typical tip length: ~500 nm
▪ Typical tip radius: ~10 nm
▪ k = ~350 N/m, f = ~750 kHz
▪ Mounted type only
▪ For exact values of tip radius (SEM image), please refer to the enclosed datasheet
Mounted Type 701,000
  BL-AC40TS (10ea.)    
610-1049 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~10 nm
▪ k = ~0.09 N/m, f = ~110 kHz
Mounted Type 921,000
610-0049 Unmounted Type 843,000
  DNP-S (10ea.)    
610-1151 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Typical tip length: 2.5 - 8 μm
▪ Typical tip radius: ~10 nm (<40 nm)
▪ k1 = ~0.35 N/m, f1 = ~65 kHz, k2 = ~0.12 N/m,
f2 = ~23 kHz, k3 = ~0.24 N/m, f3 = ~56 kHz, k4 = ~0.06 N/m, f4 = ~18 kHz,
▪ 4 triangular cantilevers on a chip
Mounted Type 818,000
610-0151 Unmounted Type 662,000
  NSC36/Cr-Au (10ea.)    
610-1002 ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0002 Unmounted Type 345,000
  PNP-DB (10ea.)    
610-1145 ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ Typical tip length: 3.5 μm
▪ k1 = ~0.48 N/m, f1 = ~67 kHz, k2 = ~0.06 N/m, f2 = ~17 kHz
▪ 2 cantilevers on a chip
Mounted Type 448,000
610-0145 Unmounted Type 318,000
  PNP-TR (10ea.)    
610-1146 ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz
▪ 2 triangular cantilevers on a chip
Mounted Type 448,000
610-0146 Unmounted Type 318,000
  QP-Bio AC (10ea.)    
610-1283 ▪ Non-Contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Typical tip length: 7 μm
▪ Typical tip radius: < 10 nm
▪ k1 = ~0.3 N/m, f1 = ~90 kHz, k2 = ~0.1 N/m, f2 = ~50 kHz, k3 = ~0.06 N/m, f3 = ~30 kHz
▪ 3 triangular cantilevers on a chip
Mounted Type 694,000
610-0283 Unmounted Type 564,000
  OMCL-AC55TS (10ea.)    
610-1199 ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Typical tip length: ~12 μm
▪ Typical tip radius: ~7 nm
▪ k = ~85 N/m, f = ~1600 kHz
Mounted Type 1,050,000
610-0199 Unmounted Type 972,000
  BL-AC40TS (10ea.)    
610-1049 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~10 nm
▪ k = ~0.09 N/m, f = ~110 kHz
Mounted Type 921,000
610-0049 Unmounted Type 843,000
  NSC36/Cr-Au (10ea.)    
610-1002 ▪ Probe for Tapping Mode in liquid
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0002 Unmounted Type 345,000
  MSNL (10ea.)    
610-1232 ▪Cantilever for Tapping Mode in liquid
▪ Backside reflex coating (Au)
▪ Typical tip length: 2.5 - 8.0 μm
▪ Typical tip radius: 2 nm
▪ k1 = ~0.07 N/m, f1 = ~22 kHz, k2 = ~0.02 N/m,
f2 = ~15 kHz, k3 = ~0.01 N/m, f3 = ~7 kHz
▪ k4 = ~0.03 N/m, f4 = ~15 kHz, k5 = ~0.1 N/m, f5 = ~38 kHz, k6 = ~0.6 N/m, f6 = ~125 kHz
▪ 6 cantilevers on a chip
Mounted Type 791,000
610-0232 Unmounted Type 662,000
  TAP300DLC (10ea.)    
610-1251 ▪Cantilever for Tapping Mode in liquid
▪ Tip shape: Rotated shape on ~15 μm setback position
▪ Hard diamond-like-carbon coated tip
▪ Typical tip length: 17 μm
▪ Typical tip radius: <15 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 474,000
610-0251 Unmounted Type 345,000
  PPP-CONT (10ea.)    
610-1111 ▪Cantilever for Tapping Mode in liquid
▪ Typical tip length: 10-15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 591,000
610-0111 Unmounted Type 461,000
  PPP-CONTSC_T (10ea.), PPP-CONTSC (10ea.)    
610-1208-03 ▪ Contact cantilever
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~25 kHz
▪ Mounted type on Teflon-coated (both sides) chip carrier
Mounted Type 591,000
610-0208 Unmounted Type 461,000
  TL-CONT (10ea.)    
610-1069 ▪ Tipless cantilever for special applications
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 591,000
610-0069 Unmounted Type 461,000
  HQ:NSC35/tipless/Al BS (15ea.)    
615-1299 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k1 = ~8.9 N/m, f1 = ~205 kHz, k2 = ~16 N/m, f2 = ~300 kHz, k3 = ~5.4 N/m, f3 = ~150 kHz
Mounted Type 1,342,000
615-0299 Unmounted Type 1,212,000
  HQ:CSC37/tipless/Al BS (15ea.)    
615-1300 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k1 = ~0.8 N/m, f1 = ~40 kHz, k2 = ~0.3 N/m, f2 = ~20 kHz, k3 = ~0.4 N/m, f3 = ~30 kHz
Mounted Type 1,342,000
615-0300 Unmounted Type 1,212,000
  ACLA-TL (10ea.)    
610-1317 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k = ~58 N/m, f = ~190 kHz
Mounted Type 482,000
610-0317 Unmounted Type 369,000
  ACTA-TL (10ea.)    
610-1318 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k = ~37 N/m, f = ~300 kHz
Mounted Type 482,000
610-0318 Unmounted Type 369,000
  ACSTA-TL (10ea.)    
610-1319 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k = ~7.8 N/m, f = ~150 kHz
Mounted Type 482,000
610-0319 Unmounted Type 369,000
  ESD-safe Package for EBD Tips    
370-0413 ▪ Contains up to 12 ea. of cantilevers ▪ Cantilevers are not included ▪ Mounting service and returning shipping costs to Park Systems are not included ▪ NOTE: Contact Park Systems for other specific cantilever models or combination.   1,176,000
  이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.
Contact

True Non Contact Mode

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
PPP-NCHR (10ea.)
610-1051 ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 494,000
610-0051 Unmounted Type 416,000
SSS-NCHR (10ea.)
610-1056 ▪ Non-contact cantilever with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,161,000
610-0056 Unmounted Type 1,083,000
BL-AC40TS (10ea.)
610-1049 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~10 nm
▪ k = ~0.09 N/m, f = ~110 kHz
Mounted Type 921,000
610-0049 Unmounted Type 843,000
OMCL-AC160TS (10ea.)
610-1183 ▪ Non-Contact cantilever with high resonant frequency 
▪ Backside reflective coating (Al)
▪ Tip shape: Sharpened tetrahedral on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: ~7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 507,000
610-0183 Unmounted Type 429,000
ATEC-NC (10ea.)
610-1020 ▪ Non-contact cantilever
▪ Tip shape: Tetrahedral tip on zero setback position
▪ Typical tip length: 15 - 20 μm
▪ Typical tip radius: <10 nm
▪ k = ~45 N/m, f = ~335 kHz
Mounted Type 713,000
610-0020 Unmounted Type 636,000
ACTA (10ea.)
610-1201 ▪ Non-contact cantilever
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Typical tip length: 14 - 16 μm
▪ Typical tip radius: ~6 nm
▪ k = ~37 N/m, f = ~300 kHz
Mounted Type 500,000
610-0201 Unmounted Type 422,000
PPP-NCH (10ea.)
610-1125 ▪ Non-contact cantilever with high resonant frequency
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 591,000
610-0125 Unmounted Type 461,000
SSS-NCH (10ea.)
610-1081 ▪ Non-contact cantilever with super sharp tip
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,277,000
610-0081 Unmounted Type 1,083,000
PPP-NCLR (10ea.)
610-1105 ▪ Non-contact cantilever with low resonant frequency 
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 591,000
610-0106 Unmounted Type 461,000
SSS-NCLR (10ea.)
610-1106 ▪ Non-contact cantilever with low resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,277,000
610-0107 Unmounted Type 1,083,000
PPP-NCL (10ea.)
610-1095 ▪ Non-contact cantilever with low resonant frequency 
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 591,000
610-0095 Unmounted Type 461,000
SSS-NCL (10ea.)
610-1094 ▪ Non-contact cantilever with low resonant frequency 
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,212,000
610-0094 Unmounted Type 1,083,000
NSC15/Al BS (10ea.)
610-1011 ▪ Non-contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k = ~40 N/m, f = ~325 kHz
Mounted Type 389,000
610-0011 Unmounted Type 312,000
AR5-NCHR (10ea.)
610-1055 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,466,000
610-0055 Unmounted Type 1,271,000
AR5-NCH (10ea.)
610-1127 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,466,000
610-0127 Unmounted Type 1,271,000
AR5-NCLR (10ea.)
610-1089 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating 
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,466,000
610-0089 Unmounted Type 1,271,000
AR5-NCL (10ea.)
610-1090 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,466,000
610-0090 Unmounted Type 1,271,000
AR5T-NCHR (10ea.)
610-1060 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 2,100,000
610-0060 Unmounted Type 1,906,000
AR5T-NCH (10ea.)
610-1126 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 2,100,000
610-0126 Unmounted Type 1,906,000
HARTA-12-2 (5ea.)
605-1123 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,114,000
605-0123 Unmounted Type 2,074,000
HARTA-12-4 (5ea.)
605-1124 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~4 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,114,000
605-0124 Unmounted Type 2,074,000
HARTA-12-6 (5ea.)
605-1138 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~6 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,535,000
605-0138 Unmounted Type 2,495,000
EBD2-100A (5ea.)
605-1132 ▪ Non-contact cantilever with high aspect ratio tip (>6:1) (HDC/DLC)
▪ Backside reflex coating 
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~2 μm
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0132 Unmounted Type 1,971,000
EBD4-200A (5ea.)
605-1139 ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating 
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~4 μm (max.)
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0139 Unmounted Type 1,971,000
EBD6-400A (5ea.)
605-1134 ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~6 μm (max.)
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0134 Unmounted Type 1,971,000
MCNT-100 (5ea.)
605-1156 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~100 nm
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 7,290,000
605-0156 Unmounted Type 7,128,000
MCNT-150 (5ea.)
605-1157 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~150 nm 
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 7,290,000
605-0157 Unmounted Type 7,128,000
MCNT-300 (5ea.)
605-1158 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~300 nm 
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0158 Unmounted Type 6,480,000
MCNT-400 (5ea.)
605-1159 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~400 nm
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0159 Unmounted Type 6,480,000
MCNT-500 (5ea.)
605-1160 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~500 nm
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0160 Unmounted Type 6,480,000
Hi'Res-C14/Cr-Au (10ea.)
610-1155 ▪ Non-contact cantilever with low resonant frequency 
▪ Backside reflective coating (Au)
▪ Typical spike length: 100 - 200 nm
▪ Typical tip radius: ~1 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 1,336,000
610-0155 Unmounted Type 1,142,000
OMCL-AC240TS (10ea.)
610-1184 ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: 7 nm
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 507,000
610-0184 Unmounted Type 429,000
이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.
Contact

FMM / F-d / PinPoint

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
PPP-FMR (10ea.)
610-1110 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~2 N/m, f = ~75 kHz
Mounted Type 591,000
610-0110 Unmounted Type 461,000
DT-FMR (10ea.)
610-1077 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~6.2 N/m, f = ~105 kHz
Mounted Type 1,887,000
610-0077 Unmounted Type 1,692,000
PPP-NCSTR (10ea.)
610-1117 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 591,000
610-0117
Unmounted Type 461,000
NSC36/Al BS (10ea.)
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 416,000
610-0001
Unmounted Type 286,000
NSC14/Hard/Al BS (10ea.)
610-1140 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 507,000
610-0140
Unmounted Type 377,000
SD-R30-CONT (10ea.)
610-1230 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 856,000
610-0230 Unmounted Type 778,000
SD-R30-FM (10ea.)
610-1229 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 856,000
610-0229 Unmounted Type 778,000
SD-R30-NCH (10ea.)
610-1228 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 856,000
610-0228 Unmounted Type 778,000
MSS-Soft (5ea.)
610-1254 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~250 nm
▪ Typical tip radius: <2 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,847,000
610-0254 Unmounted Type 1,782,000
SSS-FMR (10ea.)
610-1245 ▪ Cantilever with force constant suitable for FMM with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: 2 nm (< 5 nm)
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,277,000
610-0245 Unmounted Type 1,083,000
NSC19/Cr-Au (10ea.)
610-1234 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~0.5 N/m, f = ~65 kHz
Mounted Type 474,000
610-0234 Unmounted Type 345,000
  이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.
Contact

Contact Mode/LFM

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도*
PPP-CONTSCR (10ea.)
610-1093 ▪ Contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 532,000
610-0093 Unmounted Type 454,000
NSC36/Al BS (10ea.)
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 416,000
610-0001 Unmounted Type 286,000
NSC36/Hard/Al BS (10ea.)
610-1004 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 507,000
610-0004 Unmounted Type 377,000
PNP-DB (10ea.)
610-1145 ▪ Non-Contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Tip shape: Sharpened tetrahedral on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: ~7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 448,000
610-0145 Unmounted Type 318,000
PNP-TR (10ea.)
610-1146 ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz
▪ 2 triangular cantilevers on a chip
Mounted Type 448,000
610-0146 Unmounted Type 318,000
PPP-LFMR (10ea.)
610-1076 ▪ Contact cantilever with high sensitivity for lateral/frictional force measurement
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~23 kHz
Mounted Type 591,000
610-0076 Unmounted Type 461,000
이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.
Contact

Lithography

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다.에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
DT-NCHR (10ea.)
610-1057 ▪ Probe suitable for lithography
▪ Backside reflex coating (Al)
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
Mounted Type 1,887,000
610-0057 Unmounted Type 1,692,000
ElectriMulti75-G (10ea.)
610-1098-01 ▪ Probe for lithography and electrical modes (EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 564,000
610-0098 Unmounted Type 345,000
25Pt300B (10ea.)
610-1115-01 ▪ Probe suitable for lithography and C-AFM
▪ Contact cantilever made of platinum
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Recommended for high voltage/current application above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115
Unmounted Type 1,142,000
CDT-CONTR_T (10ea.), CDT-CONTR (10ea.)
610-1135-01
▪ Probe suitable for lithography and C-AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~0.5 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,373,000
610-0135
Unmounted Type 2,114,000
CDT-NCHR_T (10ea.), CDT-NCHR (10ea.)
610-1120-01
▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,373,000
610-0120
Unmounted Type 2,114,000
PPP-CONTSCPt (10ea.)
610-1073 ▪ Probe for lithography
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 772,000
610-0073
Unmounted Type 642,000
NSC36/Pt (10ea.)
610-1161 ▪ Probe for lithography
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0161 Unmounted Type 345,000
PPP-EFM_C (10ea.), PPP-EFM (10ea.)
610-1101-02 ▪ Probe for lithography
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
Mounted Type 772,000
610-0101 Unmounted Type 642,000
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