Lithography
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 |
|
---|---|---|---|
DT-NCHR (10ea.) | |||
610-1057 | ▪ Probe suitable for lithography ▪ Backside reflex coating (Al) ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz |
Mounted Type | 1,887,000 |
610-0057 | Unmounted Type | 1,692,000 | |
ElectriMulti75-G (10ea.) | |||
610-1098-01 | ▪ Probe for lithography and electrical modes (EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 564,000 |
610-0098 | Unmounted Type | 345,000 | |
25Pt300B (10ea.) | |||
610-1115-01 | ▪ Probe suitable for lithography and C-AFM ▪ Contact cantilever made of platinum ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,401,000 |
610-0115 |
Unmounted Type | 1,142,000 | |
CDT-CONTR_T (10ea.), CDT-CONTR (10ea.) | |||
610-1135-01 |
▪ Probe suitable for lithography and C-AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~0.5 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,373,000 |
610-0135 |
Unmounted Type | 2,114,000 | |
CDT-NCHR_T (10ea.), CDT-NCHR (10ea.) | |||
610-1120-01 |
▪ Probe suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,373,000 |
610-0120 |
Unmounted Type | 2,114,000 | |
PPP-CONTSCPt (10ea.) | |||
610-1073 | ▪ Probe for lithography ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 772,000 |
610-0073 |
Unmounted Type | 642,000 | |
NSC36/Pt (10ea.) | |||
610-1161 | ▪ Probe for lithography ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <30 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
610-0161 | Unmounted Type | 345,000 | |
PPP-EFM_C (10ea.), PPP-EFM (10ea.) | |||
610-1101-02 | ▪ Probe for lithography ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand |
Mounted Type | 772,000 |
610-0101 | Unmounted Type | 642,000 |
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