SCM
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
| Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 |
|
|---|---|---|---|
| PPP-EFM_C (10ea.), PPP-EFM (10ea.) | |||
| 610-1101-02 |
▪ Probe for DC-EFM/PFM/SCM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand |
Mounted Type | 772,000 |
| 610-0101 |
Unmounted Type | 642,000 | |
| 25Pt300B_C (10ea.), 25Pt300B (10ea.) | |||
| 610-1115-02 |
▪ Contact cantilever for conductive AFM(CP-AFM)/SCM ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,336,000 |
| 610-0115 |
Unmounted Type | 1,142,000 |
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