Surface Potential Imaging via Sideband KPFM

Sideband Kelvin Probe Force Microscopy (KPFM) is a new mode from Park Systems that allows simultaneous imaging of topography and surface potential with a high spatial resolution and improved sensitivity compared to conventional lift mode and other KPFM methods. In this method, the topography is detected at the cantilever's resonance, while the KPFM signals are detected at the sideband’s frequency, a few kHz off from the cantilever's resonant frequency. Therefore, both signals can be measured simultaneously, significantly reducing the acquisition time while improving the surface potential imaging sensitivity.

This webinar will introduce Sideband KPFM, using F₁₄H₂₀ as an object of study for the surface potential measurements.

Presented By : 
Armando Melgarejo, Park Systems Technical Support Engineer

Armando Melgarejo is an engineer for Park Systems, where he focuses on the installation and support of AFM systems for Park’s research user base. He holds a B.S. in Biotechnology Engineering from Autonomous University of Queretaro, Mexico. During his studies, he also spent a semester doing research in nanotechnology and molecular biology at Czech Technical University in Prague, Czech Republic. Other areas of expertise include diverse characterization techniques (AFM, SEM, RAMAN and IR), genetics and molecular and cell biology.