|Contact Us  Global

Accurate nanoelectronic investigations of functional materials for optoelectronics application (via PinPoint C-AFM)


Thursday, 8 April, 2021

  • 10:00 am – 11:30 am
    London, Dublin
  • 11:00 am – 12:30 pm
    Berlin, Paris, Rome
  • 18:00pm – 19:30 pm
    Seoul, Tokyo



Successful integration of semiconductor thin films in high-performance optoelectronic devices requires homogeneous electric properties across the whole film. Particularly polycrystalline layers can feature local differences in their conductivity due to morphological features such as grain boundaries or defects.

Conductive atomic force microscopy (C-AFM) is ideally suited to correlate morphology with (photo-)electric properties on polycrystalline thin films at a nanometer scale. For that, a conductive tip scans the surface in contact mode and simultaneously detects the current flow at each scan position via a sensitive current amplifier. However, lateral shear forces acting between tip and sample often cause damage during C-AFM measurements which lowers the quality of the results.

Here, we demonstrate Park systems’ PinPoint C-AFM mode enabling stable, high-resolution current imaging on optically active semiconductors. This force-spectroscopy-based approach eliminates damaging shear forces between tip and surface and thus increases reproducibility for consecutive images. Moreover, the well-defined contact force not only provides accurate and reliable C-AFM data but also offers local mechanical information like stiffness and adhesion.

Presented By : 
Ilka Hermes, Principle Scientist Park Systems Europe, Mannheim, Germany

Ilka is the principle scientist at Park Systems Europe, where she maintains and supports scientific collaborations to establish new research projects. Prior, she worked at the Max Planck Institute for Polymer Research (Main Germany) in the group of Stefan Weber to investigate perovskite solar cells with electrical Atomic Force Microscopy (AFM) modes, and at the Johannes Gutenberg University Mainz in the group of Angelika Kühnle to characterize liquid-solid interfaces with high resolution AFM. Ilka’s primary fields of expertise include Piezoresponse Force Microscopy (PFM), Kelvin Probe Force Microscopy (KFM), and conductive AFM on semiconducting and/or ferroelectric devices.




Park Lectures - Park Atomic Force Microscope