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With the theme of electric tip sample interactions, this lecture will cover additional interactions between the sample and cantilever. Topics include current measurement and magnetic measurement.

 
 
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Lecture #10: Current and magnetic measurements

Friday, December 17, 2021

  • 10:00 am – 12:00 pm
    (PDT)
    San Francisco, LA
  • 1:00 pm – 3:00 pm
    (EDT)
    Boston, New York
  • 6:00 pm – 7:00 pm
    (GMT)
    London
  • 7:00 pm – 8:00 pm
    (CET)
    Paris, Rome

Join Park Systems' upcoming online lectures and explore Atomic Force Microscopy's working principles (AFM). The course will cover AFM operational principles through lectures and interactive demo sessions with live interaction from the attendees.

· Other Fundamental Electrical Modes:
With the theme of electric tip sample interactions, this lecture will cover additional interactions between the sample and cantilever. Topics include current measurement and magnetic measurement. Discussion and questions are welcomed.

· Interactive Demo Session:
For the final session, all previous lecture topics are reinforced through demonstration and practice of current measurement on a floppy disk and magnetic interactions from written data on a hard drive sample

Presented By : 
Ben Schoenek, Senior Technical Service Engineer, Park Systems

Ben Schoenek is a Senior Technical Service Engineer for Park Systems, where he focuses on service and support of AFM systems for Park's research user base. He received his Master's in Physics from Auburn University, and holds a B.A. in Physics from Kenyon College.

 

 

 

Park Lectures - Park Atomic Force Microscope