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Magnetic Force Microscopy (MFM) is a well-known non-contact scanning probe (SPM) technique established for more than 35 years by now, that is capable of mapping near-surface magnetic textures and structures down to the 10-nm-spatial resolution. MFM becomes an indispensable and complementary tool in modern-type material analysis, especially when focusing for instance on topological and low-dimensional systems.

Park Lectures - Park Atomic Force Microscope