Thursday, June 28, 2018
- 10:00 am – 11:00 am (CST) Beijing
- *Note: This webinar will be presented in Mandarin/中文
F/D in liquid, force volume imaging, PinPoint mode are the extension of this field. For some special materials like cell, tip modify is a way for sample surface protection and easy geometric calculation. These will be discussed at this webinar.
Atomic force microscope(AFM) has a lot of scan modes for acquire topography images and other sample property images. Force distance curve is playing a important role in surface science, nanotechnology, biology and many other fields of reserch. The basic configuration of every Park AFM contains force distance spectroscopy. It does not need any special option to opearate. It looks like simple for operation, but it will involve some keys like tip selection, parameter settings, cantilever calibration, and so on. Also F/D in liquid, force volume imaging, PinPoint mode are the extension of this field. For some special materials like cell, tip modify is a way for sample surface portection and easy geometric calculation.These will be discussed at this seminar.