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Lectures

1, May 20'
Webinars
Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized ...
24, Apr 20'
Webinars
Measuring the electrostatic interaction between the atomic force microscope (AFM) tip and sample is a common technique used to characterize electrically sensitive samples...
29, Apr 20'
Webinars
As one of the most powerful scanning probe microscopy (SPM) techniques, atomic force microscopy (AFM) can not only detect the morphology of the films, but also characteri...
17, Apr 20'
Webinars
Park Systems Weekly Demo & Chat Sessions is a new series of online, live demonstrations of Park AFM Systems hosted by the Park Systems Technical team. Each week, an e...
17, Apr 20'
Webinars
La microscopía de sonda local (SPM) es una de las herramientas más versátiles para la visualización y caracterización de micro y nano sistemas. Durante este webinar se pr...
29, Apr 20'
Webinars
This webinar session will explain the basics of PinPoint SSRM and review its potential for investigating the electrical and mechanical characteristics of lithium ion batt...
15, Apr 20'
Webinars
In this Live Demo we will walk you through the quick automation set-up for research applications by using SmartScan & StepScan. ...
22, Apr 20'
Webinars
In this Live Demo we will walk you through the quick automation set-up for research applications by using SmartScan & StepScan. ...
6, May 20'
Webinars
In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control. ...
29, Apr 20'
Webinars
In this webinar, we provide an overview and introduction of three available PFM modes: Off-resonance single frequency PFM, resonance-enhanced single frequency PFM and dua...

Park Lectures - Park Atomic Force Microscope