-
PhthalocyaninePraseodymium ferromagnetic Boundary Materials SelfAssembly Etch CVD bias_mode Grain molecular_beam Alkane C36H74 Force-distance VerticalPFM mechanical property Ecoli CBD SiliconOxide YttriaStabilizedZirconia LiftHeight Lift GaP Iron oxide_layer FrictionalForceMicroscopy NTU Nanofiber Granada WPlug MechanicalProperties PANI Techcomp mono_layer Mechinical Reading
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Taegeuk Mark Lithography on PZT
Re-arranged the domain pole direction on PZT surface using bias mode of lithography.
Scanning Conditions
- System: NX10
- Scan Mode: Lithography
- Cantilever: PPP-ContScPt (k=0.2N/m, f=25kHz)
- Scan Size: 35μm×20μm
- Scan Rate: 0.5Hz
- Pixel Size: 1024 × 1024
- Tip Bias: 10V for patterned area
- Scan Mode: Lithography
- Cantilever: PPP-ContScPt (k=0.2N/m, f=25kHz)
- Scan Size: 35μm×20μm
- Scan Rate: 0.5Hz
- Pixel Size: 1024 × 1024
- Tip Bias: 10V for patterned area