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Indent mechanical_property Materials Polytetrafluoroethylene LateralPFM Chemical Vapor Deposition StrontiuTitanate SAM Singapore Terrace Cobalt-dopedIronOxide lithography SiWafer SingleLayer Liquid UTEM domain_switching INSP Conductance Display Jason EPFL Dopped I-VSpectroscopy fe_nd_b LMF BismuthFerrite Inorganic_Compound Nanotechnology SrTiO3 HanyangUniv Corrosion Ananth Solution aluminum_nitride
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Domain switching on PZT
Scanning Conditions
- System: NX10
- Scan Mode: Lithography, PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black +10V, White -10V