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Research AFM
AFM Modes
Park AFMs provide an extensive range of high-precision scanning modes, enabling accurate and efficient data collection across diverse sample types. Our industry-leading True Non-Contact™ Mode uniquely preserves tip sharpness and sample integrity by eliminating physical contact, ensuring long-term measurement reliability. From advanced Magnetic Force Microscopy to a suite of electrical and mechanical property measurement modes, Park AFMs offer unparalleled accuracy and innovation in atomic force microscopy.
