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Metal-organicComplex ElectroChemical LateralForce ThermalConductivity vertical_PFM MfmAmplitude OrganicSemiconductor organic_polymer 3-hexylthiophene ScanningTunnelingMicroscopy Magnetic Force Microscopy VerticalPFM Pores Defect bias_mode TCS BaTiO3 PolyimideFilm StrontiuTitanate atomic_layer PrCurve UnivCollegeLondon Tin sulfide AM_SKPM Piezo Resistance MultiferroicMaterials thermal_property Microchannel Boundary NtuEee Zagreb HfO2 ForceMapping Dopped