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ScanningKelvinProbeMicroscopy medical INSPParis SPMLabs single_layer ContactMode CP-AFM molecular_beam CrossSection NCM\ Perovskite PolymerBlend Optoelectronic EvatecAG temp AM_SKPM Trench Defects #EC DIWafer HafniumDioxide Varistor Zhi Galfenol kelvin probe force microscopy MechanicalProperty PolyimideFilm plastic TyphimuriumBiofilm Ito DataStorage HfO2 Aluminium_Oxide Potential IndiumTinOxide