-
Wafer Neodymium Worcester_Polytechnic_Institute Chrome Array food Melt HDD Pinpoint PFM NCM FrequencyModulation IcelandSpar OrganicCompound Ni81Fe19 Forevision BariumTitanate Iron Singapore Water BiVO4 Solution DNAProtein HexagonalBN Sadowski HafniumDioxide BiFeO3 ThermalConductivity LiftMode Alkane Mobile Magnetic Force Microscopy LDPE LowDensityPolyethylene TCS Multiferroic_materials
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SnS2 Flakes
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256