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EFM Sidewall Indent TipBiasMode thermal_property ScanningSpreadingResistanceMicroscopy Jason Polypropylene ChemicalCompound fluoroaalkane Ram molecules STM University_of_Regensburg F14H20 IndiumTinOxide doped SmalScan AIN Ferrite BCZT Implant GalliumPhosphide MagneticPhase electrospinning Glass BlockCopolymer FrictionalForceMicroscopy cooling Mechinical Thermal Polydimethylsiloxane Pipette AM-KPFM ScanningTunnelingMicroscopy
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ITO glass
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 3μm×3μm, 1μm×1μm
- Scan Rate: 0.4Hz, 1Hz
- Pixel: 512×512, 512×512