-
Reading HafniumDioxide Mfm SmallScan CrAu Polyvinylidene_fluoride NCM Sperm OxideLayer Ca10(PO4)6(OH)2 NUSNNI Film PtfeMembrane SICM Anneal MonoLayer KevlarFiber TungstenThinFilmDeposition Sidewall Tungsten Hafnia HiVacuum Hole Piranha TipBiasMode Piezo Alkane STO Mechinical SThM SingleCrystal mechanical_property BismuthFerrite FloppyDisk CastIron
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
LiNbO3 wafer
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256