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Defects Conductivity Ca10(PO4)6(OH)2 MeltingPoint molecular_self_assembly StainlessSteel IcelandSpar Tape EPFL Growing Boron fifber AdhesionEnergy Pinpoint Pore Polyaniline SiliconeOxide DNAProtein CeNSE_IISc Electical&Electronics Grain pinpoint mode FrictionalForceMicroscopy PvdfFilm StrontiumTitanate BaTiO3 thermal_conductivity light_emitting Potential Leakage PMNPT Dopped Pzt PinpointPFM SRAM
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Bacteria
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 1Hz
- Pixel:512×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 1Hz
- Pixel:512×256