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Lectures

28, Oct 20'
Webinars
In this webinar hosted by Nano Nature, guest presenter Dr. Vladimir Korolkov (Senior Application Scientist at Park Systems UK) will demonstrate how to better understand the overall structure of polymers.     ...
12, Nov 20'
Webinars
In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape. Both high resolution and high-speed sca...
3, Dec 20'
Webinars
In this webinar, we will describe and demonstrate polymer characterization using PinPointTM mapping on Park System’s NX10 atomic force microscope. Additionally, we will demonstrate example measurements where electrical property maps are acquired si...
22, Oct 20'
Webinars
本讲座以多晶ZnO基TCO薄膜的耐湿热稳定性为出发点,结合静电力力显微镜(EFM: Electrical Force microscopy)研究ZnO薄膜的晶界稳定性对耐湿热性能的影响,展示了原子力显微镜在氧化物晶界研究...
20, Oct 20'
Webinars
In this session, a variety of AFM option mode is introduced for investigating sample’s properties such as electrical, mechanical, magnetic, thermal and electrochemical properties. Based on Contact or Non-contact mode, AFM option mode can be combine...
24, Sep 20'
Webinars
导电原子力显微镜(C-AFM)是在扫描探针显微镜(SPM)基础上扩展的一种电学测试模式,它可以同时实现在纳米级对样品(比如:介质材料、量子点、电子器件)表面形貌和局部电学性质的...
22, Sep 20'
Lectures
In this session, the basic principles and the application of AFM which can be used in scientific and industrial fields are examined. In particular, we share the images measured by the actual atomic force microscope with specific examples of various a...
3, Sep 20'
Webinars
In this webinar, we will demonstrate on Park’s NX Hivac how high vacuum (10-5 Torr) significantly improves the sensitivity and the resolution of electrical AFM modes on TMDs. Register for On-DemandPlease f...
27, Aug 20'
Webinars
近年来,由于其潜在的巨大应用价值,关于二维层状材料的基础和应用研究方兴未艾,核心工作是理解和控制其多种多样的有趣性质。之前的研究工作主要集中在二维材料的面内结构,多种...
26, Aug 20'
Webinars
This webinar will introduce Sideband KPFM, using F14H20 as an object of study for the surface potential measurements.     Surface Potential Imaging via Sideband KPFM REGISTER NOW ...

Park Lectures - Park Atomic Force Microscope