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13, Jul 17'
Park in the News
Using scanning capacitance microscopy with a Park Systems atomic force microscope a team at NASA successfully characterized both the spatial variations in capacitance as ...
11, Jul 17'
Press-Release
Park NX Wafer Low Noise, High Throughput Automatic Force Profiler with Automatic Defect Review  Park continues to produce cost saving value proposition innovations ...
19, Apr 17'
Press-Release
SANTA CLARA, Calif., April 18, 2017 世界领先的原子力显微镜(AFM)制造商Park Systems近期宣布在德国海德堡设立欧洲总部,并任命 Ludger We...
14
Feb 2017'
Park in the News
SANTA CLARA, CA (Marketwired - February 13, 2017) Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, just announced that Park SmartScan a...
15
Nov 2016'
Press-Release
SANTA CLARA, CA NOVEMBER 10, 2016 Park Systems announces the 2017 Park AFM Scholarship Award eligible to undergraduate or postdoctoral students working in nanotechnology...
10
Oct 2016'
Press-Release
 SANTA CLARA, CA  October 07, 2016 Park Systems congratulates Jean-Pierre Sauvage, James Fraser Stoddart and Bernard Feringa on being awarded the 2016 Nobel Pr...
9, Oct 16'
Press-Release
纳米科学2016年卡夫利奖项的获奖者们和Park Systems的CEO在奥斯陆音乐厅参加颁奖典礼 2016年纳米科学卡夫利奖的获得者依次为 Gerd B...
5, Aug 16'
Press-Release
Park NX20 300mm – 市场上第一款能够扫描整个样品区域的原子力显微镜,它使用300毫米的真空吸盘同时保持系统噪音低于 0.5angst。 ...
4, Aug 16'
Park in the News
Atomic Force Microscopy (AFM) leader Park Systems has simplified 300mm silicon wafer defect review by automating the process of obtaining high-resolution 3D images, makin...
18, Jul 16'
Park in the News
  News from Frost & SullivanJuly 18, 2016 at 8:00 AM MOUNTAIN VIEW, Calif. — July 18, 2016 —Frost & Sullivan announced today that Park Systems, the lea...

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