Latest News
- Tuesday, 16 November 2021 Powerful New Semiconductor Tool Introduced by Park Systems Combines Atomic Force Microscopy with White Light Interferometry
- Thursday, 24 June 2021 Park Systems Announces Park FX40, the Autonomous AFM with Built-in Intelligence – A Groundbreaking New Class of Atomic Force Microscope
- Wednesday, 23 June 2021 Park Systems, Global Leader in Atomic Force Microscopy, Appoints Dr. Stefan Kaemmer as President, Park Systems Americas
- Tuesday, 22 June 2021 NanoScientific Magazine, Summer 2021
- Tuesday, 20 April 2021 Park Systems, World Leading Atomic Force Microscopy Manufacturer Hits 1 Trillion KRW Mark at KOSDAQ
Technical Articles
Monday, 18 October 2021
Quantitative frictional properties measurement using atomic force microscopy- Monday, 27 September 2021 Surface Potential Characterization of Two-Dimensional Materials through Back-Gate Voltage Biases
- Wednesday, 18 August 2021 Investigating the origin of the domain structure in the piezoresponse of hybrid perovskites
- Thursday, 05 August 2021 A New Class of Atomic Force Microscope: FX40, the Automatic AFM
- Tuesday, 27 April 2021 Moiré patterns on 2D heterostructures via atomic force microscopy
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