Latest News
- Thursday, 24 June 2021 Park Systems Announces Park FX40, the Autonomous AFM with Built-in Intelligence – A Groundbreaking New Class of Atomic Force Microscope
- Wednesday, 23 June 2021 Park Systems, Global Leader in Atomic Force Microscopy, Appoints Dr. Stefan Kaemmer as President, Park Systems Americas
- Tuesday, 22 June 2021 NanoScientific Magazine, Summer 2021
- Tuesday, 20 April 2021 Park Systems, World Leading Atomic Force Microscopy Manufacturer Hits 1 Trillion KRW Mark at KOSDAQ
- Thursday, 15 April 2021 Fraunhofer Institute for Microstructure of Materials Systems and Park Systems Announce the International SPM Symposium on Failure Analysis and Material Testing
Technical Articles
Monday, 12 July 2021
Intrinsic electrical characterization of two-dimensional transition metal dichalcogenides via scanning probe microscopy- Tuesday, 27 April 2021 Moiré patterns on 2D heterostructures via atomic force microscopy
- Tuesday, 27 April 2021 High resolution imaging of single PTFE molecules on Teflon surface
- Tuesday, 27 April 2021 Resolving the full potential
- Tuesday, 20 April 2021 2D Moiré Superlattice Electromechanical Characterization with Piezo-response Force Microscopy
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