![](/etc.clientlibs/parksystems/clientlibs/clientlib-site/resources/images/img-ellipsometers_001.png)
Imaging Spectroscopic Ellipsometry
Park Systems' Imaging Ellipsometers combine the benefits of ellipsometry and optical microscopy in a single device.
![](/etc.clientlibs/parksystems/clientlibs/clientlib-site/resources/images/img-ellipsometers_002.png)
Referenced Spectroscopic Ellipsometry
The Referenced Spectroscopic Ellipsometer (RSE) offers rapid thickness mapping for quality control.
![](/etc.clientlibs/parksystems/clientlibs/clientlib-site/resources/images/img-ellipsometers_003.png)
Brewster Angle Microscopy
Brewster Angle Microscopy technique observes ultrathin organic films on transparent substrates using Brewster angle, enhancing detection for high-contrast imaging.
![](/etc.clientlibs/parksystems/clientlibs/clientlib-site/resources/images/img-ellipsometers_004.png)
Accessories
Park Systems provides a wide range of accessories for imaging ellipsometry.