The applications team at Park Systems is proud to present an introduction to electrochemical atomic force microscopy (EC-AFM), a characterization technique derived from Atomic Force Microscopy (AFM) that can be used for monitoring the electrodeposition process during electrochemical reactions. The cyclic voltammetry (CV) technique is typically employed to investigate the electrochemical reaction mechanisms using an electrochemistry cell and a choice of potentiostat or galvanostat.

This webinar explains the basics of EC-AFM and investigation of localized electrochemical deposition and dissolution of copper using the Park NX12 AFM System.

Presented By : 
Jiali Zhang, Ph.D., Technical Support Engineer, Park Systems

Jiali Zhang, Ph.D., is an engineer for Park Systems, where she focuses on the installation and support of AFM systems for Park’s research user base. She is also responsible for researching and writing technical papers and application notes for publication and presentation at scientific conferences. She received her Ph.D. in Analytical Chemistry from the University of California, Davis, and holds a B.S. in Applied Chemistry from Donghua University in Shanghai, China. Her expertise spans numerous microscopy techniques, and areas of study have also included biological systems and 3D printing technologies.