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FX40-AFM

Accelerate Your Research

Park FX40
NX-Wafer-AFM

Accurion i4

The ultimate stability and accuracy
solution for your scientific research

NX20-AFM

Park NX20

Accurate Large Sample AFM solution
for research and failure analysis

NX-Mask-AFM

Park NX-Mask

Repair your most challenging
photomask defects

NX-Wafer-AFM

Park NX-Wafer

Industry's leading automated AFM
for in-line metrology solutions

Emerging Trends of Nanotechnology

Read the Park systems' Technical Articles about AFM to understand recent developments

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Park Systems aims to support the next generation of Trail Blazers in Nanoscience by encouraging young researchers to share and discuss their research

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AFM Probe Selection Guide
How to choose an AFM probe
AFM Probe Selection Guide Book
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MFM

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-MFMR 2.8 75 Nanosensors ▪ Cantilever for MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip		 Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
PPP-LC-MFMR 2.8 75 Nanosensors ▪ Cantilever for MFM
▪ Backside reflex coating (Al)
▪ Soft magnetic coating on the tip		 Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
PPP-LM-MFMR 2.8 75 Nanosensors ▪ Cantilever for MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment compared to PPP-MFMR		 Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
SSS-MFMR 2.8 75 Nanosensors ▪ Cantilever for high resolution MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment compared to PPP-MFMR
▪ guaranteed tip radius of curvature < 15 nm		 Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
NSC18/Co-Cr/Al BS 2.8 75 MikroMasch ▪ Cantilever for MFM
▪ Backside reflective coating (Al)
▪ Tip is coated with Co-Cr		 Request for Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
18 Series 60 75 90 1.2 2.8 5.5 225 27.5 3.0

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