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Park System’s Park XE-Bio article was selected as a cover story for the May 2013 issue of Microscopy and Analysis (Issue 6). Microscopy and Analysis is the leading international journal for microscopists, with over 46,000 subscribers and 120,000 readers worldwide.
This issue reports Professor Jiro Usukura and his team, utilizing the Park XE-Bio with its True Non-Contact Mode™, successfully capturing an image of an unroofed cell membrane with the inner side of cytoplasmic membrane.

To see the full article, please press here.

About Park XE-Bio

XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines Scanning Ion Conductance Microscopy (SICM) with True Non-Contact mode AFM and inverted optical microscope on the same platform. The modular design of  XE-Bio allows easy exchange between SICM and non-contact AFM. Designed for single live cell imaging, the combined imaging capability of SICM, AFM, and inverted optical microscope makes XE-Bio ideal for imaging biological samples, such as single living cells, in dynamic conditions. Moreover, SICM can be adapted to enable a host of powerful applications in nanoscale electrophysiology. Press here to read more.

About True Non-Contact Mode™

Park has innovated AFM technology in industry's only True Non-Contact Mode™ that minimizes tip degradation, keeps sample free from damage, and prolongs high-resolution imaging throughout the AFM scan. The True Non-Contact Mode™ is made possible by Park AFM with the development of Crosstalk Elimination, and high force Z-scanner with large Z-servo bandwidth. With the True Non-Contact Mode™, Park AFM produces the most accurate and reproducible AFM results. Press here to read more.

About Jiro Usukura’s Journal

Atomic force microscopy (AFM) combined with unroofing techniques enabled clear imaging of the intracellular cytoskeleton and the cytoplasmic surface of the cell membrane under aqueous condition. Press here to read more

Park News - Press Release | Park Atomic Force Microscope