Patterned Sapphire Substrate (PSS)
The patterned sapphire substrate was characterized in True Non-contact mode. The scan image reveals a regular array of surface structures with a peak-to-valley height of about 1.47 µm.
Scanning Conditions
- System: NX15
- Scan Mode: True Non-contact™ mode
- Scan Rate: 0.3 Hz
- Scan Size: 40 µm × 40 µm
- Pixel Size: 256 × 256 pixels
- Peak-to-valley: 1.47 µm
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