ITO Glass

 ITO glass 2

Scanning Conditions

- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512

Related Modes

Conductive AFM (C-AFM)

Related Contents

Application Notes

AFM methodologies for quality assessment of lithium-ion battery electrodes
Application Notes

Intrinsic electrical characterization of two-dimensional transition metal dichalcogenides via scanning probe microscopy
Sample Images

Graphene
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