MoS₂ Flake on TEM Grid
MoS₂ flakes transferred onto a TEM grid form lightly supported, partially suspended structures that are highly sensitive to tip–sample interaction and mechanical disturbance.
True Non-contact AFM enables stable, high-resolution, and damage-free morphology imaging, allowing reliable characterization of these delicate 2D materials.
Scan Conditions
- System: FX40
- Scan Mode: Non-contact
- Scan Size: 30 µm× 30 µm
- Scan Rate: 0.2 Hz
- Pixels: 512×512
- Cantilever: AC160TS (k=26 N/m, f=300 kHz)
×