Aplicacion de Microscopia de Barrido por Sonda (SPM) en el Analisis de Muestras del Patrimonio Cultural

Speaker : Dr. Jesús Angel Arenas Alatorre Affiliation : Instituto de Física Region : LatAm Year : 2019 Language : Spanish Delve into the diverse applications of Scanning Probe Microscopy (SPM) in analyzing cultural heritage samples. Discover how SPM techniques enable non-destructive examination, offering insights into material composition, preservation challenges, and historical insights.

Authors

Dr. Jesús Angel Arenas Alatorre

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