Live demo: 使用 FX40 进行多点快速AFM自动化测量

Speaker : Charles Kim Affiliation : Park原子力显微镜 Region : China Year : 2022 Language : English Witness a live demonstration showcasing the FX40's capabilities in executing rapid and automated Atomic Force Microscopy (AFM) measurements at multiple points. The session focuses on practical applications and operational efficiency, providing insights into the instrument's real-time performance.

Application

AFM Exclusive

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