Nanoscale Dielectric Reliability Studies on 2D Hexagonal Boron Nitride (h-BN) using Conduction AFM
Speaker : Dr. Alok Ranjan Affiliation : Singapore University of Technology and Design, Singapore Region : Asia Year : 2021 Language : English Explore dielectric reliability of 2D hexagonal boron nitride (h-BN) using Conduction AFM, vital for advancing nanoelectronics with insights into breakdown mechanisms, defect spectroscopy, and statistical analysis.
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