导电原子力显微镜在电子器件纳米级电学测试中的应用 – 2020年9月24日
SPEAKERS
-
Dr. Fei Hui
Technion-Israel Institute of Technology, Israel
- Fei Hui, Postdoctoral fellow at Technion-Israel Institute of Technology, Dr. Hui got her PhD degree in Nanoscience in 2018 at the University of Barcelona. During her PhD, she studied at Massachusetts Institute of Technology (MIT, USA) for 12 months and the University of Cambridge (UK) for 6 months. She has published over 38 research papers, 11 of them are as first author, including Nature Electronics, Advanced Functional Materials, ACS Applied Materials and Interfaces, 2D materials, Nanoscale. Moreover, Dr. Hui edited one book chapter on CAFM for Wiley-VCH, and applied for two international patents. She has been awarded 2019 Park AFM Scholarship, Mobility Grant of Royal Society of Chemistry. Her research interests focus on chemical vapor deposition of high-quality two-dimensional materials and the application in nanoelectronics
- Access Speaker Publications
SPEAKERS
-
- Dr. Fei Hui
- Technion-Israel Institute of Technology, Israel
Authors
导电原子力显微镜（C-AFM）是在扫描探针显微镜（SPM）基础上扩展的一种电学测试模式，它可以同时实现在纳米级对样品（比如：介质材料、量子点、电子器件）表面形貌和局部电学性质的表征和测试。C-AFM 技术在纳米电子学、半导体材料等领域广泛应用，主要用于表征样品/器件的缺陷分布、电导率局部变化、局部电学行为等。本报告将重点围绕C-AFM在忆阻型电子器件中的电学表征，介绍不同环境（大气和真空状态）下测试结果的可靠性，以及通过使用基于C-AFM技术的不同手段来直接观测导电细丝的形成以进一步探索阻变机理。
Related Contents
_Ondemand.png)
%20Webinar.png)
×