Unraveling the History of Atomic Force Microscopy
SPEAKERS
  • Sang-il Park
    CEO at Park Systems
Authors
Sang-il Park

In this insightful presentation, Dr. Sang-il Park, founder and CEO of Park Systems, delves into the fascinating history and groundbreaking advancements in Atomic Force Microscopy (AFM). Dr. Park traces the origins of AFM back to its 1985 invention by G. Binnig, C.F. Quate, and Ch. Gerber at Stanford University, where he studied under the guidance of Prof. Quate. He highlights the transformative innovations he spearheaded to commercialize AFM technology, including the development of the flexure-based orthogonal scan system, non-contact mode operation in air, Z-servo optimization, and automation features. These innovations revolutionized the field, setting new standards for precision and usability in AFM systems.

With over three decades of advancements, Dr. Park showcases how AFM has become a critical tool for nanotechnology, driving innovation in semiconductor metrology, materials science, and beyond. In his presentation, he discusses the pivotal role of AFM in shaping next-generation technologies and its expanding influence in fields such as life sciences and material research.

Join Dr. Park as he sheds light on the past, present, and future of AFM, a technology that continues to redefine the boundaries of nanoscale research and industrial production.