Webinars

Dr. Park will explore the origins of AFM, tracing it back to its 1985 invention by G. Binnig, C.F. Quate, and Ch. Gerber at Stanford University, where Dr. Park himself studied under Prof. Quate. Dr. Park will delve into the groundbreaking innovations he led to commercialize AFM technology, such as the introduction of the flexure-based orthogonal scan system, non-contact mode operation in air, Z-servo optimization, and system automation. These breakthroughs not only revolutionized the capabilities of AFM but also set new industry standards in precision and usability, solidifying Park Systems as a leader in the AFM market.

With over three decades of advancements, AFM has become a cornerstone in the semiconductor industry, providing nanometer-level accuracy that is critical for the development of next-generation materials and devices. “AFM is not just a scientific instrument; it is now a critical tool that drives innovation in industries ranging from semiconductor metrology to materials science,” Dr. Park stated. “The ability to measure and manipulate matter at the atomic level is transforming our understanding of nanotechnology and how we approach research and industrial production.”

His presentation will not only shed light on the history of AFM but also outline its future role in shaping advanced technological fields, including life sciences, material research, and beyond.