_v2.jpg)
Imaging spectroscopic ellipsometry involves combining the sensitivity of ellipsometry to detect changes in film thickness and optical properties with the imaging capabilities of optical microscopy. This unique combination enables thin film metrology as well as the determination of optical properties at the microscopic scale.
Lead-halide perovskite solar cells are very promising from a performance point of view in the fields of photovoltaics, optoelectronics, light-emitting diodes, lasers, and photodetectors. Most of these applications require a deep understanding of the optical properties of the material. It is important to note that the grain size must be related to the optical properties, as the film may contain crystalline and amorphous portions depending on the crystallization method. A critical aspect is stability against environmental influences.
One focus of the webinar will be on the extraction of clear spectra from samples with local layer thickness variations, and another will be the assessment of material stability at the microscopic scale by comparing Delta and Psi micro-maps at variable wavelengths. The webinar will be completed with a demonstration of the instrument highlighting the new sweep mode—a game changer in ellipsometry?
Dr. Peter H. Thiesen
Application Specialist ISE, ISE Support, Park Systems GmbH
Peter received his PhD in chemistry from Kiel University in 1996. He worked for one year on a research project for the former Wella AG and then joined the Helmut Schmidt University in Hamburg, where he set up a lab for adsorption research and surface characterization, including ellipsometry. In 2006, he joined the former Nanofilm Technology GmbH as a sales manager and application specialist for imaging ellipsometry and Brewster angle microscopy. He has been a strong advocate for the benefits of imaging spectroscopic ellipsometry and has presented this technique at a number of scientific conferences and workshops. He has installed systems and trained users in more than 20 countries worldwide and spent one year in Ann Arbor, Michigan, with Accurion. He is the author/co-author of more than 30 scientific publications on a broad range of surface chemically related topics, like the intracrystalline salinization of layered crystalline silicic acids, SiO2-based nanofluids, protein immobilization for affinity separation technologies, hierarchical clustering of odor compounds, odor control, and especially the characterization of 2D materials and other applications of imaging spectroscopic ellipsometry.