The Latest Advances in AFM for Nanotechnology (NJIT)
In proud partnership with the New Jersey Institute of Technology, Park Systems is proud to announce a free workshop and live demo to take place on October 6, 2016 at Tiernan Hall and the Otto H. York Center for Environmental Engineering and Science. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.