Image size and lateral resolution in Atomic Force Microscope (AFM) images are generally traded off against each other as the AFM records a certain number of pixels per a given scan length, as defined by the operator. Therefore, the larger the image with the same number of pixels, the less lateral resolution is recorded. Additionally, the lateral movement of the scanner piezo limits the AFM to 100 µm images. To counter this, SmartScan™ has built in features to program the tool to take a grid of images to make a higher resolution image as a combination of multiple images, or to take larger scans than the scanner allows. This is accomplished by combining lateral stage movement with automatic approach and imaging features. This demo will highlight one of the two methods supplied with Parks SmartScan™ software.